{"title":"新千年面板中的IEC可靠性标准","authors":"G. Alstead, J. Moss, D. Kiang, V. Loll, D. Mahy","doi":"10.1109/RAMS.2000.816302","DOIUrl":null,"url":null,"abstract":"The intent of this session is to present the current status of the IEC Dependability Technical Committee and its plans for the future. To do this an able and experienced group of TC56 participants has been assembled to provide views on how TC56 is facing the challenges of the new millenium. Although TC 56 representatives have appeared regularly at past RAMS the notion of Dependability is still not well established in the US. It will be useful therefore to review the official defmition:","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"IEC dependability standards in the new millennium panel\",\"authors\":\"G. Alstead, J. Moss, D. Kiang, V. Loll, D. Mahy\",\"doi\":\"10.1109/RAMS.2000.816302\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The intent of this session is to present the current status of the IEC Dependability Technical Committee and its plans for the future. To do this an able and experienced group of TC56 participants has been assembled to provide views on how TC56 is facing the challenges of the new millenium. Although TC 56 representatives have appeared regularly at past RAMS the notion of Dependability is still not well established in the US. It will be useful therefore to review the official defmition:\",\"PeriodicalId\":178321,\"journal\":{\"name\":\"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-01-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.2000.816302\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2000.816302","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
IEC dependability standards in the new millennium panel
The intent of this session is to present the current status of the IEC Dependability Technical Committee and its plans for the future. To do this an able and experienced group of TC56 participants has been assembled to provide views on how TC56 is facing the challenges of the new millenium. Although TC 56 representatives have appeared regularly at past RAMS the notion of Dependability is still not well established in the US. It will be useful therefore to review the official defmition:
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