{"title":"采用QPSK调制的微波器件的工业结合射频和系统测试","authors":"W. Sahyoun, J. Duchamp, P. Benech","doi":"10.1109/MWSYM.2011.5972835","DOIUrl":null,"url":null,"abstract":"Vector Network Analyzer is considered as the classical characterization instrument for RF-devices but it requires time, equipments and increases the cost of tested equipments. A new method is presented and suggested for industrial test of microwave devices. This procedure is based on EVM system-parameter linked to transmission S-parameter. The procedure of the test is easier and six times faster than VNA test. A single value of EVM allows knowing the functionality of the device and few points describe the RF-device characteristics. First tests were done on Butterworth filters of different orders.","PeriodicalId":294862,"journal":{"name":"2011 IEEE MTT-S International Microwave Symposium","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Industrial combining RF and system test of microwave devices using QPSK modulation\",\"authors\":\"W. Sahyoun, J. Duchamp, P. Benech\",\"doi\":\"10.1109/MWSYM.2011.5972835\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Vector Network Analyzer is considered as the classical characterization instrument for RF-devices but it requires time, equipments and increases the cost of tested equipments. A new method is presented and suggested for industrial test of microwave devices. This procedure is based on EVM system-parameter linked to transmission S-parameter. The procedure of the test is easier and six times faster than VNA test. A single value of EVM allows knowing the functionality of the device and few points describe the RF-device characteristics. First tests were done on Butterworth filters of different orders.\",\"PeriodicalId\":294862,\"journal\":{\"name\":\"2011 IEEE MTT-S International Microwave Symposium\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE MTT-S International Microwave Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.2011.5972835\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE MTT-S International Microwave Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.2011.5972835","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Industrial combining RF and system test of microwave devices using QPSK modulation
Vector Network Analyzer is considered as the classical characterization instrument for RF-devices but it requires time, equipments and increases the cost of tested equipments. A new method is presented and suggested for industrial test of microwave devices. This procedure is based on EVM system-parameter linked to transmission S-parameter. The procedure of the test is easier and six times faster than VNA test. A single value of EVM allows knowing the functionality of the device and few points describe the RF-device characteristics. First tests were done on Butterworth filters of different orders.
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