开关电容电路的符号故障建模

2013 IEEE International Conference of IEEE Region 10 (TENCON 2013) Pub Date : 2013-10-01 DOI:10.1109/TENCON.2013.6719067

J. Cheng, G. Shi, Andy Tai, F. Lee

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引用次数: 7

摘要

提出了一种允许参数极限运算的符号构造方法。通过创建以二进制决策图(BDD)形式表示的符号z域传递函数，可以用这种方法分析开关电容电路。操纵BDD中的符号可以模拟各种电路故障，如开关故障、电容故障和运放增益故障。给出了实现方法并给出了实例说明。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Symbolic fault modeling for switched-capacitor circuits

A symbolic construction method allowing for parameter limit operation is proposed. Switched-capacitor circuits can be analyzed with this method by creating a symbolic z-domain transfer function represented in the form of a Binary Decision Diagram (BDD). Manipulating the symbols in BDD can simulate a variety of circuit faults, such as switch faults, capacitor faults, and opamp gain faults. Implementation methods are presented and illustration examples are provided.

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2013 IEEE International Conference of IEEE Region 10 (TENCON 2013)

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