改进的同步时序电路故障仿真

J. Raik, P. Ellervee, Valentin Tihhomirov, R. Ubar
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引用次数: 6

摘要

本文提出了利用FPGA硬件仿真加速时序电路故障仿真的新方法。故障仿真是测试模式生成中的一项重要子任务,在测试模式生成过程中经常用到。对时序电路的故障仿真相关的问题进行了解释,并讨论了替代实现。给出了故障仿真的硬件仿真环境。它集成了硬件对故障排除的支持。与目前最先进的故障模拟方法相比,所提出的方法可以使仿真速度提高40到500倍。该方法提供的平均加速为250,比先前文献中引用的大约高一个数量级。实验表明,在需要大量测试向量的情况下,使用仿真是有益的。
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Improved fault emulation for synchronous sequential circuits
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is frequently used throughout the test generation process. The problems associated to fault emulation for sequential circuits are explained and alternative implementations are discussed. An environment for hardware emulation of fault simulation is presented. It incorporates hardware support for fault dropping. The proposed approach allows simulation speed-up of 40 to 500 times as compared to the state-of-the-art in fault simulation. Average speedup provided by the method is 250 that is about an order of magnitude higher than previously cited in the literature. Based on the experiments, we can conclude that it is beneficial to use emulation when large numbers of test vectors is required.
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