E. Wolak, K. Kuppuswamy, J. Harrison, Xu Jin, Hanxuan Li, B. Fidric, R. Miller, P. Cross, T. Towe, T. Truchan, Hoa Nguyen, C. Edirisinghe
{"title":"高可靠的多条纹激光二极管","authors":"E. Wolak, K. Kuppuswamy, J. Harrison, Xu Jin, Hanxuan Li, B. Fidric, R. Miller, P. Cross, T. Towe, T. Truchan, Hoa Nguyen, C. Edirisinghe","doi":"10.1109/ECTC.2008.4550101","DOIUrl":null,"url":null,"abstract":"This paper describes reliability data for multi-stripe arrays of laser diodes with limited emitter count. The empirical behavior of these arrays is compared with a model based on independent random failures of the individual stripes in a multi-element array operating in an ensemble mode. Such reliability data is of particular interest for multi-mode multi- stripe laser pump modules operating in the 910 nm to 990 nm wavelength range.","PeriodicalId":378788,"journal":{"name":"2008 58th Electronic Components and Technology Conference","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Highly reliable multi stripe laser diodes\",\"authors\":\"E. Wolak, K. Kuppuswamy, J. Harrison, Xu Jin, Hanxuan Li, B. Fidric, R. Miller, P. Cross, T. Towe, T. Truchan, Hoa Nguyen, C. Edirisinghe\",\"doi\":\"10.1109/ECTC.2008.4550101\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes reliability data for multi-stripe arrays of laser diodes with limited emitter count. The empirical behavior of these arrays is compared with a model based on independent random failures of the individual stripes in a multi-element array operating in an ensemble mode. Such reliability data is of particular interest for multi-mode multi- stripe laser pump modules operating in the 910 nm to 990 nm wavelength range.\",\"PeriodicalId\":378788,\"journal\":{\"name\":\"2008 58th Electronic Components and Technology Conference\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 58th Electronic Components and Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2008.4550101\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 58th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2008.4550101","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper describes reliability data for multi-stripe arrays of laser diodes with limited emitter count. The empirical behavior of these arrays is compared with a model based on independent random failures of the individual stripes in a multi-element array operating in an ensemble mode. Such reliability data is of particular interest for multi-mode multi- stripe laser pump modules operating in the 910 nm to 990 nm wavelength range.