{"title":"微波功率GaN hemt的非线性器件模型","authors":"P. Cabral, J. Pedro, N. Carvalho","doi":"10.1109/MWSYM.2004.1335795","DOIUrl":null,"url":null,"abstract":"This paper presents a new nonlinear device model, for microwave power GaN HEMTs, amenable for integration into a commercial harmonic balance simulator. All the steps taken to extract it are explained, starting with the extrinsic elements' determination and ending with the intrinsic ones. This model was validated by comparing measured and simulated output power and intermodulation distortion data of a GaN HEMT. Very good agreement was obtained from small- to large-signal excitation regimes.","PeriodicalId":334675,"journal":{"name":"2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":"{\"title\":\"New nonlinear device model for microwave power GaN HEMTs\",\"authors\":\"P. Cabral, J. Pedro, N. Carvalho\",\"doi\":\"10.1109/MWSYM.2004.1335795\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new nonlinear device model, for microwave power GaN HEMTs, amenable for integration into a commercial harmonic balance simulator. All the steps taken to extract it are explained, starting with the extrinsic elements' determination and ending with the intrinsic ones. This model was validated by comparing measured and simulated output power and intermodulation distortion data of a GaN HEMT. Very good agreement was obtained from small- to large-signal excitation regimes.\",\"PeriodicalId\":334675,\"journal\":{\"name\":\"2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-06-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.2004.1335795\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.2004.1335795","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New nonlinear device model for microwave power GaN HEMTs
This paper presents a new nonlinear device model, for microwave power GaN HEMTs, amenable for integration into a commercial harmonic balance simulator. All the steps taken to extract it are explained, starting with the extrinsic elements' determination and ending with the intrinsic ones. This model was validated by comparing measured and simulated output power and intermodulation distortion data of a GaN HEMT. Very good agreement was obtained from small- to large-signal excitation regimes.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
