{"title":"A test platform implementing SPC in a low-volume, high-mix test department","authors":"D. L. Stanley, R.F. Duncan, G.W. Smith","doi":"10.1109/AUTEST.1997.633687","DOIUrl":null,"url":null,"abstract":"The development of a PC-based functional test platform that incorporates Statistical Process Control (SPC) and a failure analysis database is described. With Commercial Off-The-Shelf(COTS) tools available it is possible in a low volume high-mix environment to easily obtain basic statistical information on each test, develop an easily accessible database of information on failures, causes of failures and troubleshooting activities and increase test efficiency with minimal test development costs. A common test platform has been developed that can be configured to test a wide variety of sub-assemblies from digital controller cards to radio frequency (RF) modules. The platform consists of a PC with a multi-function data acquisition card and a General Purpose Interface Bus (GPIB) card for control of test instruments. Applications are linked with Dynamic Data Exchange (DDE) and the PCs are connected to the company's Local Area Network (LAN) so that test data can be accessed from throughout the plant. A key point is the implementation of SPC with this test platform. Statistics include process capability indices C/sub p/ and C/sub pk/ and failure rate. Test data is analyzed and used to make process improvements. Examples are presented. Since the entire system has been designed and built around established COTS software and hardware, additional capabilities can be easily added in the future. Some planned enhancements are described.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"261 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1997.633687","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A test platform implementing SPC in a low-volume, high-mix test department
The development of a PC-based functional test platform that incorporates Statistical Process Control (SPC) and a failure analysis database is described. With Commercial Off-The-Shelf(COTS) tools available it is possible in a low volume high-mix environment to easily obtain basic statistical information on each test, develop an easily accessible database of information on failures, causes of failures and troubleshooting activities and increase test efficiency with minimal test development costs. A common test platform has been developed that can be configured to test a wide variety of sub-assemblies from digital controller cards to radio frequency (RF) modules. The platform consists of a PC with a multi-function data acquisition card and a General Purpose Interface Bus (GPIB) card for control of test instruments. Applications are linked with Dynamic Data Exchange (DDE) and the PCs are connected to the company's Local Area Network (LAN) so that test data can be accessed from throughout the plant. A key point is the implementation of SPC with this test platform. Statistics include process capability indices C/sub p/ and C/sub pk/ and failure rate. Test data is analyzed and used to make process improvements. Examples are presented. Since the entire system has been designed and built around established COTS software and hardware, additional capabilities can be easily added in the future. Some planned enhancements are described.