{"title":"减轻相变存储器结构中的写入干扰:正在进行的工作","authors":"Chao H. Huang, Ishan G. Thakkar","doi":"10.1145/3349569.3351539","DOIUrl":null,"url":null,"abstract":"Phase Change Memory (PCM) is seen as a potential candidate that can replace DRAM as main memory, due to its better scalability. However, writing `0s' in PCM cells requires high-temperature RESET operations, which induce write disturbance errors in neighboring idle PCM cells due to excessive heat dissipation. This paper introduces low-temperature partial-RESET operations for writing `0s' in PCM cells. Compared to traditional RESET operations, partial-RESET operations dissipate negligible heat, and therefore, do not cause disturbance errors in neighboring cells during PCM writes.","PeriodicalId":306252,"journal":{"name":"Proceedings of the International Conference on Compliers, Architectures and Synthesis for Embedded Systems Companion","volume":"153 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Mitigating write disturbance in phase change memory architectures: work-in-progress\",\"authors\":\"Chao H. Huang, Ishan G. Thakkar\",\"doi\":\"10.1145/3349569.3351539\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Phase Change Memory (PCM) is seen as a potential candidate that can replace DRAM as main memory, due to its better scalability. However, writing `0s' in PCM cells requires high-temperature RESET operations, which induce write disturbance errors in neighboring idle PCM cells due to excessive heat dissipation. This paper introduces low-temperature partial-RESET operations for writing `0s' in PCM cells. Compared to traditional RESET operations, partial-RESET operations dissipate negligible heat, and therefore, do not cause disturbance errors in neighboring cells during PCM writes.\",\"PeriodicalId\":306252,\"journal\":{\"name\":\"Proceedings of the International Conference on Compliers, Architectures and Synthesis for Embedded Systems Companion\",\"volume\":\"153 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the International Conference on Compliers, Architectures and Synthesis for Embedded Systems Companion\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3349569.3351539\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Compliers, Architectures and Synthesis for Embedded Systems Companion","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3349569.3351539","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Mitigating write disturbance in phase change memory architectures: work-in-progress
Phase Change Memory (PCM) is seen as a potential candidate that can replace DRAM as main memory, due to its better scalability. However, writing `0s' in PCM cells requires high-temperature RESET operations, which induce write disturbance errors in neighboring idle PCM cells due to excessive heat dissipation. This paper introduces low-temperature partial-RESET operations for writing `0s' in PCM cells. Compared to traditional RESET operations, partial-RESET operations dissipate negligible heat, and therefore, do not cause disturbance errors in neighboring cells during PCM writes.