{"title":"规划和优化环境应力筛选","authors":"Y. Mok, M. Xie","doi":"10.1109/RAMS.1996.500662","DOIUrl":null,"url":null,"abstract":"Environmental stress screening (ESS) is widely used in the electronics industries as a means to remove early failures. It is a process that calls for proper planning as inadequate duration is ineffective while prolonged screening can incur unnecessary cost. This note describes an approach utilizing mathematical programming to ensure that the right amount of screening is in place at each assembly level. The factors considered include the screening cost and desired operational reliability.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Planning and optimizing environmental stress screening\",\"authors\":\"Y. Mok, M. Xie\",\"doi\":\"10.1109/RAMS.1996.500662\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Environmental stress screening (ESS) is widely used in the electronics industries as a means to remove early failures. It is a process that calls for proper planning as inadequate duration is ineffective while prolonged screening can incur unnecessary cost. This note describes an approach utilizing mathematical programming to ensure that the right amount of screening is in place at each assembly level. The factors considered include the screening cost and desired operational reliability.\",\"PeriodicalId\":393833,\"journal\":{\"name\":\"Proceedings of 1996 Annual Reliability and Maintainability Symposium\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-01-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1996 Annual Reliability and Maintainability Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.1996.500662\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.1996.500662","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Planning and optimizing environmental stress screening
Environmental stress screening (ESS) is widely used in the electronics industries as a means to remove early failures. It is a process that calls for proper planning as inadequate duration is ineffective while prolonged screening can incur unnecessary cost. This note describes an approach utilizing mathematical programming to ensure that the right amount of screening is in place at each assembly level. The factors considered include the screening cost and desired operational reliability.
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