{"title":"Intel 80/spl times/86处理器的伪随机与确定性测试","authors":"J. Sosnowski, A. Kusmierczyk","doi":"10.1109/EURMIC.1996.546398","DOIUrl":null,"url":null,"abstract":"The paper deals with the problem of testing microprocessors in the system environment. We discuss two approaches to testing microprocessors: deterministic and pseudorandom. They are related to Intel 80/spl times/86 processors. Many drawbacks of the deterministic approach can be overcome with pseudorandom tests. However developing pseudorandom test programs we face some other problems. The paper shows how to combine the two approaches.","PeriodicalId":311520,"journal":{"name":"Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Pseudorandom versus deterministic testing of Intel 80/spl times/86 processors\",\"authors\":\"J. Sosnowski, A. Kusmierczyk\",\"doi\":\"10.1109/EURMIC.1996.546398\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper deals with the problem of testing microprocessors in the system environment. We discuss two approaches to testing microprocessors: deterministic and pseudorandom. They are related to Intel 80/spl times/86 processors. Many drawbacks of the deterministic approach can be overcome with pseudorandom tests. However developing pseudorandom test programs we face some other problems. The paper shows how to combine the two approaches.\",\"PeriodicalId\":311520,\"journal\":{\"name\":\"Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-09-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EURMIC.1996.546398\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURMIC.1996.546398","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Pseudorandom versus deterministic testing of Intel 80/spl times/86 processors
The paper deals with the problem of testing microprocessors in the system environment. We discuss two approaches to testing microprocessors: deterministic and pseudorandom. They are related to Intel 80/spl times/86 processors. Many drawbacks of the deterministic approach can be overcome with pseudorandom tests. However developing pseudorandom test programs we face some other problems. The paper shows how to combine the two approaches.
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