{"title":"门级商业微电子验证与标准细胞识别","authors":"L. A. Hsia, M. Lanzerotti, M. Seery, L. Orlando","doi":"10.1109/NAECON.2014.7045839","DOIUrl":null,"url":null,"abstract":"The DARPA TRUST program was established to address the need to verify integrated circuits (ICs). This paper explores methodologies to resolve conflicts among IC designs in prior applications of commercial software to verify designs ranging in size from 1 to 283,359 cells. Preliminary results show the capability of commercial software tools to generate test cases for evaluation.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Gate-level commercial microelectronics verification with standard cell recognition\",\"authors\":\"L. A. Hsia, M. Lanzerotti, M. Seery, L. Orlando\",\"doi\":\"10.1109/NAECON.2014.7045839\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The DARPA TRUST program was established to address the need to verify integrated circuits (ICs). This paper explores methodologies to resolve conflicts among IC designs in prior applications of commercial software to verify designs ranging in size from 1 to 283,359 cells. Preliminary results show the capability of commercial software tools to generate test cases for evaluation.\",\"PeriodicalId\":318539,\"journal\":{\"name\":\"NAECON 2014 - IEEE National Aerospace and Electronics Conference\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NAECON 2014 - IEEE National Aerospace and Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NAECON.2014.7045839\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.2014.7045839","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Gate-level commercial microelectronics verification with standard cell recognition
The DARPA TRUST program was established to address the need to verify integrated circuits (ICs). This paper explores methodologies to resolve conflicts among IC designs in prior applications of commercial software to verify designs ranging in size from 1 to 283,359 cells. Preliminary results show the capability of commercial software tools to generate test cases for evaluation.
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