先进的闪光灯退火技术,适用于22nm及更远的器件

H. Kiyama, S. Kato, T. Aoyama, T. Onizawa, K. Ikeda, H. Kondo, K. Hashimoto, H. Murakawa, Toru Kuroiwa
{"title":"先进的闪光灯退火技术,适用于22nm及更远的器件","authors":"H. Kiyama, S. Kato, T. Aoyama, T. Onizawa, K. Ikeda, H. Kondo, K. Hashimoto, H. Murakawa, Toru Kuroiwa","doi":"10.1109/IWJT.2010.5474999","DOIUrl":null,"url":null,"abstract":"Idea of a very short time annealing technology has evaluated in 1980s. Engineers tried to use Flash lamp, laser or some other lamps [1]. In 1990s, W-halogen lamp annealing replaced furnace annealing in activation and silicidation process. Thermal budget has reduced from minutes to seconds. Eager for Milli-second Annealing (MSA) really came out in 2000s. Since dopant diffusion and an activation ratio have been considered to be more critical obstacle in scaled down microstructure devices, FLA activation technology came into spotlight again [2–9]. A 65nm device was a first product which used Flash Lamp Annealing (FLA) in manufacturing. Today, milli-second process has become an indispensable method in device manufacturing. But device generation keeps proceeding 45nm, 32nm and so on. Furthermore, a new material like high-k/metal is selected as a latest device material. Difficulty in MSA for 32 and 22 generation devices is reported recently.","PeriodicalId":205070,"journal":{"name":"2010 International Workshop on Junction Technology Extended Abstracts","volume":"167 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Advanced Flash Lamp Annealing technology for 22nm and further device\",\"authors\":\"H. Kiyama, S. Kato, T. Aoyama, T. Onizawa, K. Ikeda, H. Kondo, K. Hashimoto, H. Murakawa, Toru Kuroiwa\",\"doi\":\"10.1109/IWJT.2010.5474999\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Idea of a very short time annealing technology has evaluated in 1980s. Engineers tried to use Flash lamp, laser or some other lamps [1]. In 1990s, W-halogen lamp annealing replaced furnace annealing in activation and silicidation process. Thermal budget has reduced from minutes to seconds. Eager for Milli-second Annealing (MSA) really came out in 2000s. Since dopant diffusion and an activation ratio have been considered to be more critical obstacle in scaled down microstructure devices, FLA activation technology came into spotlight again [2–9]. A 65nm device was a first product which used Flash Lamp Annealing (FLA) in manufacturing. Today, milli-second process has become an indispensable method in device manufacturing. But device generation keeps proceeding 45nm, 32nm and so on. Furthermore, a new material like high-k/metal is selected as a latest device material. Difficulty in MSA for 32 and 22 generation devices is reported recently.\",\"PeriodicalId\":205070,\"journal\":{\"name\":\"2010 International Workshop on Junction Technology Extended Abstracts\",\"volume\":\"167 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Workshop on Junction Technology Extended Abstracts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWJT.2010.5474999\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Workshop on Junction Technology Extended Abstracts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWJT.2010.5474999","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

短时间退火技术的思想在20世纪80年代得到了评价。工程师们尝试使用闪光灯、激光或其他一些灯[1]。20世纪90年代,钨卤素灯退火取代了炉退火在活化和硅化工艺中的应用。热收支从几分钟缩短到几秒钟。渴望毫秒退火(Eager for毫秒退火,MSA)在2000年才真正出现。由于掺杂剂扩散和激活比被认为是微结构器件缩小的关键障碍,FLA激活技术再次受到关注[2-9]。65nm器件是第一个采用闪光灯退火技术(FLA)制造的器件。如今,毫秒制程已经成为器件制造中不可或缺的一种方法。但器件的生产一直在45nm、32nm等工艺上进行。此外,还选择了高k/金属等新材料作为最新的器件材料。最近报道了32代和22代器件的MSA困难。
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Advanced Flash Lamp Annealing technology for 22nm and further device
Idea of a very short time annealing technology has evaluated in 1980s. Engineers tried to use Flash lamp, laser or some other lamps [1]. In 1990s, W-halogen lamp annealing replaced furnace annealing in activation and silicidation process. Thermal budget has reduced from minutes to seconds. Eager for Milli-second Annealing (MSA) really came out in 2000s. Since dopant diffusion and an activation ratio have been considered to be more critical obstacle in scaled down microstructure devices, FLA activation technology came into spotlight again [2–9]. A 65nm device was a first product which used Flash Lamp Annealing (FLA) in manufacturing. Today, milli-second process has become an indispensable method in device manufacturing. But device generation keeps proceeding 45nm, 32nm and so on. Furthermore, a new material like high-k/metal is selected as a latest device material. Difficulty in MSA for 32 and 22 generation devices is reported recently.
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