{"title":"基于符号的鲁棒分段线性混沌映射及其在基于微控制器的低成本随机位发生器中的应用","authors":"P. Ketthong, W. San-Um","doi":"10.1109/IEECON.2014.6925909","DOIUrl":null,"url":null,"abstract":"This paper presents anew random-bit generator. The random signal source is a new signum-based piecewise-linear chaotic map, which provides not only robust chaos against parameter changes but also symmetric bifurcation for zero-thresholding for digital random-bit generation. Chaos dynamics are described in terms of equilibrium and Jacobian analysis, bifurcation diagram, Lyapunov exponent, time-and frequency domain signal, and cobweb plots. Autocorrelation, histogram, and NIST standard tests suite have been realized for statistical analysis of randomness of binary sequence, and the sufficient length of 1,000,000 bits successfully passed all NIST standard tests. Experimental results of digital random-bit sequences on have been performed using Microcontroller. The proposed random-bit generator offers a potential alternative in compact and robust random bit sequence for applications in computer information security.","PeriodicalId":306512,"journal":{"name":"2014 International Electrical Engineering Congress (iEECON)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A robust signum-based piecewise-linaer chaotic map and its application to microcontroller-based cost-effective random-bit generator\",\"authors\":\"P. Ketthong, W. San-Um\",\"doi\":\"10.1109/IEECON.2014.6925909\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents anew random-bit generator. The random signal source is a new signum-based piecewise-linear chaotic map, which provides not only robust chaos against parameter changes but also symmetric bifurcation for zero-thresholding for digital random-bit generation. Chaos dynamics are described in terms of equilibrium and Jacobian analysis, bifurcation diagram, Lyapunov exponent, time-and frequency domain signal, and cobweb plots. Autocorrelation, histogram, and NIST standard tests suite have been realized for statistical analysis of randomness of binary sequence, and the sufficient length of 1,000,000 bits successfully passed all NIST standard tests. Experimental results of digital random-bit sequences on have been performed using Microcontroller. The proposed random-bit generator offers a potential alternative in compact and robust random bit sequence for applications in computer information security.\",\"PeriodicalId\":306512,\"journal\":{\"name\":\"2014 International Electrical Engineering Congress (iEECON)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-03-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 International Electrical Engineering Congress (iEECON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEECON.2014.6925909\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Electrical Engineering Congress (iEECON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEECON.2014.6925909","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A robust signum-based piecewise-linaer chaotic map and its application to microcontroller-based cost-effective random-bit generator
This paper presents anew random-bit generator. The random signal source is a new signum-based piecewise-linear chaotic map, which provides not only robust chaos against parameter changes but also symmetric bifurcation for zero-thresholding for digital random-bit generation. Chaos dynamics are described in terms of equilibrium and Jacobian analysis, bifurcation diagram, Lyapunov exponent, time-and frequency domain signal, and cobweb plots. Autocorrelation, histogram, and NIST standard tests suite have been realized for statistical analysis of randomness of binary sequence, and the sufficient length of 1,000,000 bits successfully passed all NIST standard tests. Experimental results of digital random-bit sequences on have been performed using Microcontroller. The proposed random-bit generator offers a potential alternative in compact and robust random bit sequence for applications in computer information security.