{"title":"用有限初等线法研究周期微带结构","authors":"S. Senouci, A. Zerguerras","doi":"10.11648/J.AJPA.20170504.12","DOIUrl":null,"url":null,"abstract":"This \"Paper\" presents a comparison of the results obtained by means of the Finite Elementary Lines (EEL) approach to those obtained by other authors in the characterization of periodic microstrip structures on the localization, the width at - 20 dB and the depth of the rejection band. Designers of stop-band or pass-band filters find in this approach of FEL a safe and effective way to get inexpensive design and achievement that best meets their expectations.","PeriodicalId":329149,"journal":{"name":"American Journal of Physics and Applications","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Study of Periodic Microstrip Structures Using Finite Elementary Lines (FEL) Approach\",\"authors\":\"S. Senouci, A. Zerguerras\",\"doi\":\"10.11648/J.AJPA.20170504.12\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This \\\"Paper\\\" presents a comparison of the results obtained by means of the Finite Elementary Lines (EEL) approach to those obtained by other authors in the characterization of periodic microstrip structures on the localization, the width at - 20 dB and the depth of the rejection band. Designers of stop-band or pass-band filters find in this approach of FEL a safe and effective way to get inexpensive design and achievement that best meets their expectations.\",\"PeriodicalId\":329149,\"journal\":{\"name\":\"American Journal of Physics and Applications\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"American Journal of Physics and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.11648/J.AJPA.20170504.12\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"American Journal of Physics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11648/J.AJPA.20170504.12","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Study of Periodic Microstrip Structures Using Finite Elementary Lines (FEL) Approach
This "Paper" presents a comparison of the results obtained by means of the Finite Elementary Lines (EEL) approach to those obtained by other authors in the characterization of periodic microstrip structures on the localization, the width at - 20 dB and the depth of the rejection band. Designers of stop-band or pass-band filters find in this approach of FEL a safe and effective way to get inexpensive design and achievement that best meets their expectations.
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