案例研究——使用still作为测试模式语言

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1270913

Daniel Fan, Steve Roehling, Rusty Carruth

{"title":"案例研究——使用still作为测试模式语言","authors":"Daniel Fan, Steve Roehling, Rusty Carruth","doi":"10.1109/TEST.2003.1270913","DOIUrl":null,"url":null,"abstract":"This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture Automated Test Equipment (ATE) platform. The advantages of this approach in extensibility and easy interface with Electronic Design Automation (EDA) tools for the ATE user are presented. Some challenges of using STIL as a general purpose ATE test pattern language are also presented. The overall EDA and ATE strategy and pattern system architecture based upon STIL are discussed.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Case study - using stil as test pattern language\",\"authors\":\"Daniel Fan, Steve Roehling, Rusty Carruth\",\"doi\":\"10.1109/TEST.2003.1270913\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture Automated Test Equipment (ATE) platform. The advantages of this approach in extensibility and easy interface with Electronic Design Automation (EDA) tools for the ATE user are presented. Some challenges of using STIL as a general purpose ATE test pattern language are also presented. The overall EDA and ATE strategy and pattern system architecture based upon STIL are discussed.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1270913\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1270913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文描述了使用STIL [1] (IEEE标准测试接口语言(1450-1999))在下一代开放架构自动化测试设备(ATE)平台上实现测试模式语言。该方法具有可扩展性和易于与电子设计自动化(EDA)工具对接的优点。本文还提出了使用STIL作为通用ATE测试模式语言的一些挑战。讨论了基于STIL的EDA和ATE总体策略和模式系统架构。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Case study - using stil as test pattern language

This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture Automated Test Equipment (ATE) platform. The advantages of this approach in extensibility and easy interface with Electronic Design Automation (EDA) tools for the ATE user are presented. Some challenges of using STIL as a general purpose ATE test pattern language are also presented. The overall EDA and ATE strategy and pattern system architecture based upon STIL are discussed.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

International Test Conference, 2003. Proceedings. ITC 2003.

自引率

0.00%

发文量

期刊最新文献

Fault pattern oriented defect diagnosis for memories A built-in self-repair scheme for semiconductor memories with 2-d redundancy Cost-effective approach for reducing soft error failure rate in logic circuits A new maximal diagnosis algorithm for bus-structured systems Test vector generation based on correlation model for ratio-I/sub DDQ/