{"title":"晶体振荡器频率与温度特性的规范和测量","authors":"R. Filler, V. Rosati, S.S. Schodowski, J. Vig","doi":"10.1109/FREQ.1989.68874","DOIUrl":null,"url":null,"abstract":"Several factors are reviewed for specifying and measuring the frequency vs. temperature (f-T) characteristics of precision quartz crystal oscillators. Topics include static vs. dynamic measurement, thermal time constant, activity dips, condensables, hysteresis, and trim effect. This work reviews some f-T considerations that are not discussed in detail in MIL-0-55310.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Specification and measurement of the frequency versus temperature characteristics of crystal oscillators\",\"authors\":\"R. Filler, V. Rosati, S.S. Schodowski, J. Vig\",\"doi\":\"10.1109/FREQ.1989.68874\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Several factors are reviewed for specifying and measuring the frequency vs. temperature (f-T) characteristics of precision quartz crystal oscillators. Topics include static vs. dynamic measurement, thermal time constant, activity dips, condensables, hysteresis, and trim effect. This work reviews some f-T considerations that are not discussed in detail in MIL-0-55310.<<ETX>>\",\"PeriodicalId\":294361,\"journal\":{\"name\":\"Proceedings of the 43rd Annual Symposium on Frequency Control\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 43rd Annual Symposium on Frequency Control\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.1989.68874\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 43rd Annual Symposium on Frequency Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.1989.68874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Specification and measurement of the frequency versus temperature characteristics of crystal oscillators
Several factors are reviewed for specifying and measuring the frequency vs. temperature (f-T) characteristics of precision quartz crystal oscillators. Topics include static vs. dynamic measurement, thermal time constant, activity dips, condensables, hysteresis, and trim effect. This work reviews some f-T considerations that are not discussed in detail in MIL-0-55310.<>