{"title":"非均匀线束辐射磁化率的数值计算方法","authors":"S. Barmada, M. Raugi, F. Maradei","doi":"10.1109/ICSMC2.2003.1428262","DOIUrl":null,"url":null,"abstract":"A numerical procedure for the analysis of the transient voltages induced by external fields on multiconductor nonuniform wire bundles is presented. The cable bundle is modeled as a multiconductor transmission line (MTL). The evaluation of the per unit length (p.u.l.) parameters of the bundle is evaluated by a hybrid analytical-finite element procedure. Then, the MTL equations characterized by p.u.l. parameters depending on frequency and on position are expanded on a wavelet basis. An algebraic system describing voltage and current along the line is derived in the frequency domain. The time domain solution is achieved by inverse FFT. The procedure is validated in simple configurations","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A numerical procedure for the evaluation of the radiated susceptibility of non-uniform wire bundles\",\"authors\":\"S. Barmada, M. Raugi, F. Maradei\",\"doi\":\"10.1109/ICSMC2.2003.1428262\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A numerical procedure for the analysis of the transient voltages induced by external fields on multiconductor nonuniform wire bundles is presented. The cable bundle is modeled as a multiconductor transmission line (MTL). The evaluation of the per unit length (p.u.l.) parameters of the bundle is evaluated by a hybrid analytical-finite element procedure. Then, the MTL equations characterized by p.u.l. parameters depending on frequency and on position are expanded on a wavelet basis. An algebraic system describing voltage and current along the line is derived in the frequency domain. The time domain solution is achieved by inverse FFT. The procedure is validated in simple configurations\",\"PeriodicalId\":272545,\"journal\":{\"name\":\"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSMC2.2003.1428262\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSMC2.2003.1428262","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A numerical procedure for the evaluation of the radiated susceptibility of non-uniform wire bundles
A numerical procedure for the analysis of the transient voltages induced by external fields on multiconductor nonuniform wire bundles is presented. The cable bundle is modeled as a multiconductor transmission line (MTL). The evaluation of the per unit length (p.u.l.) parameters of the bundle is evaluated by a hybrid analytical-finite element procedure. Then, the MTL equations characterized by p.u.l. parameters depending on frequency and on position are expanded on a wavelet basis. An algebraic system describing voltage and current along the line is derived in the frequency domain. The time domain solution is achieved by inverse FFT. The procedure is validated in simple configurations