Z. Sikorski, M. Turowski, Y. Jiang, T. Czyszanowski, A. Prezekwas, M. Wartak
{"title":"垂直腔面发射激光器的多物理场建模工具","authors":"Z. Sikorski, M. Turowski, Y. Jiang, T. Czyszanowski, A. Prezekwas, M. Wartak","doi":"10.1109/NUSOD.2003.1259043","DOIUrl":null,"url":null,"abstract":"The paper presents latest enhancements to the CFD-ACE+ Multiphysics O'SEMI module including efficient optics modeling, material gain modeling, coupled laser near-field optics and automated extraction of compact models from high-fidelity simulations, for system level design. As an example of practical design problem, computational results obtained for the steady-state DC current crowding analysis in an intra-cavity contacted VCSEL is presented. A transient analysis is also performed to compute optical mode competition, I-V and L-I characteristics, parametric simulation, and device design optimization.","PeriodicalId":206987,"journal":{"name":"IEEE/LEOS 3rd International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, 2003. Proceedings","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Multiphysics modeling tools for vertical cavity surface emitting lasers\",\"authors\":\"Z. Sikorski, M. Turowski, Y. Jiang, T. Czyszanowski, A. Prezekwas, M. Wartak\",\"doi\":\"10.1109/NUSOD.2003.1259043\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents latest enhancements to the CFD-ACE+ Multiphysics O'SEMI module including efficient optics modeling, material gain modeling, coupled laser near-field optics and automated extraction of compact models from high-fidelity simulations, for system level design. As an example of practical design problem, computational results obtained for the steady-state DC current crowding analysis in an intra-cavity contacted VCSEL is presented. A transient analysis is also performed to compute optical mode competition, I-V and L-I characteristics, parametric simulation, and device design optimization.\",\"PeriodicalId\":206987,\"journal\":{\"name\":\"IEEE/LEOS 3rd International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, 2003. Proceedings\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/LEOS 3rd International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, 2003. Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NUSOD.2003.1259043\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/LEOS 3rd International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, 2003. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUSOD.2003.1259043","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Multiphysics modeling tools for vertical cavity surface emitting lasers
The paper presents latest enhancements to the CFD-ACE+ Multiphysics O'SEMI module including efficient optics modeling, material gain modeling, coupled laser near-field optics and automated extraction of compact models from high-fidelity simulations, for system level design. As an example of practical design problem, computational results obtained for the steady-state DC current crowding analysis in an intra-cavity contacted VCSEL is presented. A transient analysis is also performed to compute optical mode competition, I-V and L-I characteristics, parametric simulation, and device design optimization.