{"title":"分析改进软件缺陷预测的进化算法","authors":"R. Malhotra, Anshul Khurana","doi":"10.1109/ICRITO.2017.8342442","DOIUrl":null,"url":null,"abstract":"Defect prediction of software is necessary to determine defective parts of software. Defect prediction models are elaborated with the help of software metrics when combined with defective data to predict the classes that are defective. In this paper we have used datasets that statistically resolve the relationship among software metrics and defect vulnerability. The main intent of this paper are 1) Feature selection for defect prediction using proposed evolutionary algorithm 2) Comparing machine learning techniques 3) Use of precision and recall as performance measure for defect prediction 4) 10- fold validation is performed on every model. In this discourse, we predict defective class using 5 machine learning techniques and 2 evolutionary techniques for feature selection. In this work, we have applied evolutionary algorithms for feature selection suitable for each of the classification techniques applied on five open source android packages. Finally, for validation of calculated results, 10-fold validation is used. The results show that using evolutionary algorithms for feature selection can improve precision and recall for RF, DT and SVM. Precision and recall have best rise using SVM model. The use of evolutionary algorithms don't effect precision and recall for statistical classifier. The results obtained from evaluation thus confirm about the prediction of default classes using evolutionary algorithms is better than using only machine learning techniques. The analyzed and calculated results gave us the view about the usage of evolutionary algorithm with statistical classifier is of no use.","PeriodicalId":357118,"journal":{"name":"2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Analysis of evolutionary algorithms to improve software defect prediction\",\"authors\":\"R. Malhotra, Anshul Khurana\",\"doi\":\"10.1109/ICRITO.2017.8342442\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Defect prediction of software is necessary to determine defective parts of software. Defect prediction models are elaborated with the help of software metrics when combined with defective data to predict the classes that are defective. In this paper we have used datasets that statistically resolve the relationship among software metrics and defect vulnerability. The main intent of this paper are 1) Feature selection for defect prediction using proposed evolutionary algorithm 2) Comparing machine learning techniques 3) Use of precision and recall as performance measure for defect prediction 4) 10- fold validation is performed on every model. In this discourse, we predict defective class using 5 machine learning techniques and 2 evolutionary techniques for feature selection. In this work, we have applied evolutionary algorithms for feature selection suitable for each of the classification techniques applied on five open source android packages. Finally, for validation of calculated results, 10-fold validation is used. The results show that using evolutionary algorithms for feature selection can improve precision and recall for RF, DT and SVM. Precision and recall have best rise using SVM model. The use of evolutionary algorithms don't effect precision and recall for statistical classifier. The results obtained from evaluation thus confirm about the prediction of default classes using evolutionary algorithms is better than using only machine learning techniques. The analyzed and calculated results gave us the view about the usage of evolutionary algorithm with statistical classifier is of no use.\",\"PeriodicalId\":357118,\"journal\":{\"name\":\"2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICRITO.2017.8342442\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICRITO.2017.8342442","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

软件缺陷预测是确定软件缺陷部分的必要条件。当与有缺陷的数据相结合时,缺陷预测模型在软件度量的帮助下被详细阐述,以预测有缺陷的类。在本文中,我们使用数据集来统计地解决软件度量和缺陷脆弱性之间的关系。本文的主要目的是:1)使用提出的进化算法进行缺陷预测的特征选择;2)比较机器学习技术;3)使用精度和召回率作为缺陷预测的性能度量;4)对每个模型进行10倍验证。在本文中,我们使用5种机器学习技术和2种进化技术进行特征选择来预测缺陷类。在这项工作中,我们应用进化算法进行特征选择,适用于五个开源android软件包上应用的每种分类技术。最后,对计算结果进行10倍验证。结果表明,使用进化算法进行特征选择可以提高RF、DT和SVM的查全率和查全率。支持向量机模型的准确率和召回率均有较好的提高。进化算法的使用不影响统计分类器的准确率和召回率。因此,从评估中获得的结果证实了使用进化算法预测默认类比仅使用机器学习技术更好。分析和计算的结果使我们认识到使用统计分类器的进化算法是无用的。
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Analysis of evolutionary algorithms to improve software defect prediction
Defect prediction of software is necessary to determine defective parts of software. Defect prediction models are elaborated with the help of software metrics when combined with defective data to predict the classes that are defective. In this paper we have used datasets that statistically resolve the relationship among software metrics and defect vulnerability. The main intent of this paper are 1) Feature selection for defect prediction using proposed evolutionary algorithm 2) Comparing machine learning techniques 3) Use of precision and recall as performance measure for defect prediction 4) 10- fold validation is performed on every model. In this discourse, we predict defective class using 5 machine learning techniques and 2 evolutionary techniques for feature selection. In this work, we have applied evolutionary algorithms for feature selection suitable for each of the classification techniques applied on five open source android packages. Finally, for validation of calculated results, 10-fold validation is used. The results show that using evolutionary algorithms for feature selection can improve precision and recall for RF, DT and SVM. Precision and recall have best rise using SVM model. The use of evolutionary algorithms don't effect precision and recall for statistical classifier. The results obtained from evaluation thus confirm about the prediction of default classes using evolutionary algorithms is better than using only machine learning techniques. The analyzed and calculated results gave us the view about the usage of evolutionary algorithm with statistical classifier is of no use.
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