基于体积驱动技术的内置电流传感器设计

Tsung-Chu Huang, Min-Cheng Huang, Kuen-Jong Lee
{"title":"基于体积驱动技术的内置电流传感器设计","authors":"Tsung-Chu Huang, Min-Cheng Huang, Kuen-Jong Lee","doi":"10.1109/ATS.1997.643987","DOIUrl":null,"url":null,"abstract":"Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes end respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead.","PeriodicalId":330767,"journal":{"name":"Proceedings Sixth Asian Test Symposium (ATS'97)","volume":"120 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Built-in current sensor designs based on the bulk-driven technique\",\"authors\":\"Tsung-Chu Huang, Min-Cheng Huang, Kuen-Jong Lee\",\"doi\":\"10.1109/ATS.1997.643987\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes end respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead.\",\"PeriodicalId\":330767,\"journal\":{\"name\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"volume\":\"120 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1997.643987\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Sixth Asian Test Symposium (ATS'97)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1997.643987","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

近年来,体驱动电流镜技术已被应用于低压环境下的内置电流传感器中。本文提出了基于该技术的4种内置电流传感器布置方式。它们主要在偏置方案上有所不同,各自具有简单、精确、灵活和低功耗的优点。实验表明,这些传感器对性能的影响很小,仅造成0.3 V的电源电压下降和0.3 ns的电路速度下降延迟。这些传感器需要一个外部电源和小面积的开销。
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Built-in current sensor designs based on the bulk-driven technique
Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes end respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead.
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