{"title":"制造的统计公差方法","authors":"S. Miller","doi":"10.1109/ELECTR.1991.718225","DOIUrl":null,"url":null,"abstract":"This goal of this paper is to present a computational methodology based upon statistical tolerance models that we have employed for many and diverse applications that has particular value as a concurrent engineering technique and, thus, a technique for improving product quality and reliability. We will present the generic framework that we follow that is common to all applications of this technique. Then we will give two real-life examples of applications of this methodology and how it was used to achieve several of the goals of concurrent and computer aided engineering.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Statistical Tolerance Methods For Manufacturing\",\"authors\":\"S. Miller\",\"doi\":\"10.1109/ELECTR.1991.718225\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This goal of this paper is to present a computational methodology based upon statistical tolerance models that we have employed for many and diverse applications that has particular value as a concurrent engineering technique and, thus, a technique for improving product quality and reliability. We will present the generic framework that we follow that is common to all applications of this technique. Then we will give two real-life examples of applications of this methodology and how it was used to achieve several of the goals of concurrent and computer aided engineering.\",\"PeriodicalId\":339281,\"journal\":{\"name\":\"Electro International, 1991\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-04-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electro International, 1991\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELECTR.1991.718225\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electro International, 1991","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELECTR.1991.718225","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This goal of this paper is to present a computational methodology based upon statistical tolerance models that we have employed for many and diverse applications that has particular value as a concurrent engineering technique and, thus, a technique for improving product quality and reliability. We will present the generic framework that we follow that is common to all applications of this technique. Then we will give two real-life examples of applications of this methodology and how it was used to achieve several of the goals of concurrent and computer aided engineering.