{"title":"第二代系统内部分析程序","authors":"W. Duff, H. Schuman, L. Thompson, D. Pflug","doi":"10.1109/ISEMC.1979.7568830","DOIUrl":null,"url":null,"abstract":"The second generation intrasystem analysis program (IAP-II) should provide the EMC system designer with a very general analysis tool that may be used on a variety of different types of EMC analysis problems. IAP-II will provide capabilities ranging from a microscopic analysis of one of the elements Of the system analysis problem (e.g., a nonlinear circuit analysis or a method of moments coupling analysis) to a macroscopic analysis of the total system.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Second Generation Intrasystem Analysis Program\",\"authors\":\"W. Duff, H. Schuman, L. Thompson, D. Pflug\",\"doi\":\"10.1109/ISEMC.1979.7568830\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The second generation intrasystem analysis program (IAP-II) should provide the EMC system designer with a very general analysis tool that may be used on a variety of different types of EMC analysis problems. IAP-II will provide capabilities ranging from a microscopic analysis of one of the elements Of the system analysis problem (e.g., a nonlinear circuit analysis or a method of moments coupling analysis) to a macroscopic analysis of the total system.\",\"PeriodicalId\":283257,\"journal\":{\"name\":\"1979 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1979-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1979 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1979.7568830\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1979 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1979.7568830","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The second generation intrasystem analysis program (IAP-II) should provide the EMC system designer with a very general analysis tool that may be used on a variety of different types of EMC analysis problems. IAP-II will provide capabilities ranging from a microscopic analysis of one of the elements Of the system analysis problem (e.g., a nonlinear circuit analysis or a method of moments coupling analysis) to a macroscopic analysis of the total system.
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