Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568857
G. G. Sundberg
This paper addresses the role of EMC and instrumentation engineering in a modern equipped aerospace environmental engineering laboratory. It includes the EMC/TEI+IPEST testing instrumentation and related EMC applications in other areas of environmental engineering and instrumentation. There is a definite need to encourage young electrical/electronic engineers to consider entering the field of environmental and EMC engineering. These fields are often absent in college curriculums, therefore, the young graduate engineer is unfamiliar in these areas and is reluctant to consider them as a career. A wide variety of engineering areas are involved in providing the required instrumentation to properly measure the various parameters encountered in EMC and other environmental testing. An area which is presently being expanded in the environmental test field is that of computer application in acquisition, processing and storing data. This activity provides openings for engineers with the ability to supply microprocessing, software, computer interface and data analysis. Hughes is presently investigating the possibility of installing a centralized desk top computer system in the environmental laboratory. Every instrument used in conjunction with this system will be accessible to software. The investigation includes the possibility of using this system universally throughout the laboratory functions. This paper describes these various testing activities and instrumentation applications in the environmental engineering department of the Hughes Ground Systems Group at Fullerton, California.
{"title":"The Relationship of EMC and Instrumentation Engineering in the Environmental Laboratory","authors":"G. G. Sundberg","doi":"10.1109/ISEMC.1979.7568857","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568857","url":null,"abstract":"This paper addresses the role of EMC and instrumentation engineering in a modern equipped aerospace environmental engineering laboratory. It includes the EMC/TEI+IPEST testing instrumentation and related EMC applications in other areas of environmental engineering and instrumentation. There is a definite need to encourage young electrical/electronic engineers to consider entering the field of environmental and EMC engineering. These fields are often absent in college curriculums, therefore, the young graduate engineer is unfamiliar in these areas and is reluctant to consider them as a career. A wide variety of engineering areas are involved in providing the required instrumentation to properly measure the various parameters encountered in EMC and other environmental testing. An area which is presently being expanded in the environmental test field is that of computer application in acquisition, processing and storing data. This activity provides openings for engineers with the ability to supply microprocessing, software, computer interface and data analysis. Hughes is presently investigating the possibility of installing a centralized desk top computer system in the environmental laboratory. Every instrument used in conjunction with this system will be accessible to software. The investigation includes the possibility of using this system universally throughout the laboratory functions. This paper describes these various testing activities and instrumentation applications in the environmental engineering department of the Hughes Ground Systems Group at Fullerton, California.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115695317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568826
C. Paul
An investigation of the effect of pigtails (exposed sections of shielded wires) on the coupling to braided-shield cables is presented. It is found that even though the lengths of these exposed sections of a shielded wire may constitute only a very small portion of the total line length, they may, depending on the terminal impedances of the shielded line, constitute the dominant coupling mechanism for the braided-shield cable. For situations in which pigtail coupling is dominant, the shield simply serves to reduce the exposed section of the interior wire from what it would be if no shield were present. Thus, the shield provides some reduction in coupling, but the effectiveness of the shield is shown to be as much as 30 dB less than it would be if the pigtail lengths were minimized. Experimental results are given to support these conclusions.
{"title":"Effect of Pigtails on Coupling to Shielded Wires","authors":"C. Paul","doi":"10.1109/ISEMC.1979.7568826","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568826","url":null,"abstract":"An investigation of the effect of pigtails (exposed sections of shielded wires) on the coupling to braided-shield cables is presented. It is found that even though the lengths of these exposed sections of a shielded wire may constitute only a very small portion of the total line length, they may, depending on the terminal impedances of the shielded line, constitute the dominant coupling mechanism for the braided-shield cable. For situations in which pigtail coupling is dominant, the shield simply serves to reduce the exposed section of the interior wire from what it would be if no shield were present. Thus, the shield provides some reduction in coupling, but the effectiveness of the shield is shown to be as much as 30 dB less than it would be if the pigtail lengths were minimized. Experimental results are given to support these conclusions.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127334822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568802
G. Dike, R. Wallenberg, J. Birkin
There has recently been a proliferation of measurements of the magnetic and electric shielding effectiveness of composite materials. In order to relate these measurements, the transfer impedance concept can be used. Approximations relating surface transfer impedance to shielding effectiveness are derived for basic shield geometries. The independence of surface transfer impedance from geometry and incident field type is then exploited so that shielding effectiveness data for basic shield geometries may be extended to calculate the electromagnetic shielding for more general geometries.
{"title":"Electromagnetic Relationships Between Shielding Effectiveness and Transfer Impedance","authors":"G. Dike, R. Wallenberg, J. Birkin","doi":"10.1109/ISEMC.1979.7568802","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568802","url":null,"abstract":"There has recently been a proliferation of measurements of the magnetic and electric shielding effectiveness of composite materials. In order to relate these measurements, the transfer impedance concept can be used. Approximations relating surface transfer impedance to shielding effectiveness are derived for basic shield geometries. The independence of surface transfer impedance from geometry and incident field type is then exploited so that shielding effectiveness data for basic shield geometries may be extended to calculate the electromagnetic shielding for more general geometries.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124801793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568854
M. Kanda
A broadband, isotropic, real-time, electric-field sensor (BIRES) developed by the National Bureau of Standards (NBS) consists of three resistively loaded dipoles mounted orthogonally to each other. It has the capability of measuring frequency, polarization, magnitude, and phase information of the incident electromagnetic (EM) field. The typical tangential sensitivity of the SIRES is 13 to 16 μV/m with a typical usable dynamic range of 125 to 144 dB for various bandwidths in the frequency range of 10 MHz to 1 GHz. The isotropic response of the BIRES is obtained by arithmetically calculating the Hermitian magnitude of the incident electric field, and its variation is found to be less than +1 dB.
{"title":"A Broadband, Isotropic, Real-Time, Electric-Field Sensor (BIRES) Using Resistively Loaded Dipoles for EMI Measurements","authors":"M. Kanda","doi":"10.1109/ISEMC.1979.7568854","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568854","url":null,"abstract":"A broadband, isotropic, real-time, electric-field sensor (BIRES) developed by the National Bureau of Standards (NBS) consists of three resistively loaded dipoles mounted orthogonally to each other. It has the capability of measuring frequency, polarization, magnitude, and phase information of the incident electromagnetic (EM) field. The typical tangential sensitivity of the SIRES is 13 to 16 μV/m with a typical usable dynamic range of 125 to 144 dB for various bandwidths in the frequency range of 10 MHz to 1 GHz. The isotropic response of the BIRES is obtained by arithmetically calculating the Hermitian magnitude of the incident electric field, and its variation is found to be less than +1 dB.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115349893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568832
Harold J. Price
An improved Prony algorithm is described which produces a lower sum of squares of residuals than the usual Prony Algorithm. Indeed, the new algorithm produces the lowest sum of squares of residuals possible. A simple numerical example is used to compare the new and old algorithms. Within the context of the new algorithm, a technique to constrain poles is also described.
{"title":"An Improved Prony Algorithm for Exponential Analysis","authors":"Harold J. Price","doi":"10.1109/ISEMC.1979.7568832","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568832","url":null,"abstract":"An improved Prony algorithm is described which produces a lower sum of squares of residuals than the usual Prony Algorithm. Indeed, the new algorithm produces the lowest sum of squares of residuals possible. A simple numerical example is used to compare the new and old algorithms. Within the context of the new algorithm, a technique to constrain poles is also described.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"324 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122438446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568796
T. Fang, J. Whalen, Gordon K. C. Chen
Applications of the Nonlinear Circuit Analysis Program NCAP to calculate RFI effects in electronic circuits containing discrete semiconductor devices and small scale linear bipolar integrated circuits (differential pairs) have been reported upon previously. The objective of this paper is to demonstrate that the computer program NCAP can also be used to calculate RFI effects in linear bipolar integrated circuits (ICs) of greater complexity. The IC reported upon is the μA741 operational amplifier (op amp) which is one of the most widely used ICs. The μA741 op amp was used as the active component in a unity gain buffer amplifier. The computer program NCAP was used to predict how amplitude modulated RF signals are demodulated in the op amp to cause undesired low frequency responses. The predicted and measured results for RF frequencies in the .050 to 100 MHz range are in good agreement. Contained in the paper is a complete set of NCAP parameter values for all the transistors in the μA741 op amp. These parameter values may be used as typical data for similar transistors in other bipolar integrated circuits.
{"title":"Using NCAP to Predict RFI Effects in Operational Amplifiers","authors":"T. Fang, J. Whalen, Gordon K. C. Chen","doi":"10.1109/ISEMC.1979.7568796","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568796","url":null,"abstract":"Applications of the Nonlinear Circuit Analysis Program NCAP to calculate RFI effects in electronic circuits containing discrete semiconductor devices and small scale linear bipolar integrated circuits (differential pairs) have been reported upon previously. The objective of this paper is to demonstrate that the computer program NCAP can also be used to calculate RFI effects in linear bipolar integrated circuits (ICs) of greater complexity. The IC reported upon is the μA741 operational amplifier (op amp) which is one of the most widely used ICs. The μA741 op amp was used as the active component in a unity gain buffer amplifier. The computer program NCAP was used to predict how amplitude modulated RF signals are demodulated in the op amp to cause undesired low frequency responses. The predicted and measured results for RF frequencies in the .050 to 100 MHz range are in good agreement. Contained in the paper is a complete set of NCAP parameter values for all the transistors in the μA741 op amp. These parameter values may be used as typical data for similar transistors in other bipolar integrated circuits.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129314634","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568795
P. McBrayer, B. Showalter
The Navy F-18 Fighter Aircraft's Radio Frequency environment on a carrier deck is known from MIL-HB-235. These levels have been analyzed by "method of moments" and trade offs were made for the aircraft weight and the equipment costs which initiated the development of high RF current filter pin connectors. Special tests and procedures were developed for these connectors. Several manufacturers are approved as suppliers of these high density packaged devices. This paper discusses the analysis and trade study results and the general design and application techniques for filter pin connectors.
{"title":"RF Compatibility-Environment to Component Part","authors":"P. McBrayer, B. Showalter","doi":"10.1109/ISEMC.1979.7568795","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568795","url":null,"abstract":"The Navy F-18 Fighter Aircraft's Radio Frequency environment on a carrier deck is known from MIL-HB-235. These levels have been analyzed by \"method of moments\" and trade offs were made for the aircraft weight and the equipment costs which initiated the development of high RF current filter pin connectors. Special tests and procedures were developed for these connectors. Several manufacturers are approved as suppliers of these high density packaged devices. This paper discusses the analysis and trade study results and the general design and application techniques for filter pin connectors.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130157895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568801
J. Birken
Non-metallic materials will replace aluminum in the V/STOL airframe. Fiber-optics are being considered to compensate the material's low frequency transparency. Quantitative predictions and measurements are being conducted to assure that fiber-optic immunity is adequate and essential.
{"title":"Determination if Fiber-Optic Immunity is Adequate for Deployment in the V/STOL Airframe","authors":"J. Birken","doi":"10.1109/ISEMC.1979.7568801","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568801","url":null,"abstract":"Non-metallic materials will replace aluminum in the V/STOL airframe. Fiber-optics are being considered to compensate the material's low frequency transparency. Quantitative predictions and measurements are being conducted to assure that fiber-optic immunity is adequate and essential.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131017641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568783
B. Démoulin, P. Degauque, R. Gabillard
We present time-domain measurements to determine the shielding properties of braided coaxial cables. We show the influence of the transfer inductance and capacitance for various geometrical structures of the braid and, furthermore, that the waveform of the response signal depends on the optical coverage ratio of the shield.
{"title":"Transient Response of Braided-Wire Shields","authors":"B. Démoulin, P. Degauque, R. Gabillard","doi":"10.1109/ISEMC.1979.7568783","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568783","url":null,"abstract":"We present time-domain measurements to determine the shielding properties of braided coaxial cables. We show the influence of the transfer inductance and capacitance for various geometrical structures of the braid and, furthermore, that the waveform of the response signal depends on the optical coverage ratio of the shield.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133706194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1979-10-01DOI: 10.1109/ISEMC.1979.7568852
E. Bronaugh, D. R. Kerns
The Low Frequency RS03 Rod Antenna, used in conjunction with a suitable signal source, will produce electric fields greater than 50 volts per metre at a distance of one metre from the radiating element over the frequency range 10 kHz to 2 MHz. Less than 100 watts is required to produce the 50 V/m E-Fields. Later developments covering the range of frequencies from 2 MHz to 30 MHz are also reported. The antennas consist of four components-the base, counterpoise, radiating element, and top hat.
{"title":"Rod Antennas for High-Strength Radiated Susceptibility Tests from VLF to HF","authors":"E. Bronaugh, D. R. Kerns","doi":"10.1109/ISEMC.1979.7568852","DOIUrl":"https://doi.org/10.1109/ISEMC.1979.7568852","url":null,"abstract":"The Low Frequency RS03 Rod Antenna, used in conjunction with a suitable signal source, will produce electric fields greater than 50 volts per metre at a distance of one metre from the radiating element over the frequency range 10 kHz to 2 MHz. Less than 100 watts is required to produce the 50 V/m E-Fields. Later developments covering the range of frequencies from 2 MHz to 30 MHz are also reported. The antennas consist of four components-the base, counterpoise, radiating element, and top hat.","PeriodicalId":283257,"journal":{"name":"1979 IEEE International Symposium on Electromagnetic Compatibility","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132659960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：