{"title":"40帧/秒16×16采用90nm 1V CMOS的温度探头阵列，在VLSI芯片上进行在线热监测","authors":"M. Sasaki, T. Inoue, M. Ikeda, K. Asada","doi":"10.1109/ASSCC.2007.4425781","DOIUrl":null,"url":null,"abstract":"This paper presents a 16times16 temperature probe array using 90 nm IV CMOS, which shows plusmn1.4degC error for 40 ~ 110degC temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.","PeriodicalId":186095,"journal":{"name":"2007 IEEE Asian Solid-State Circuits Conference","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip\",\"authors\":\"M. Sasaki, T. Inoue, M. Ikeda, K. Asada\",\"doi\":\"10.1109/ASSCC.2007.4425781\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a 16times16 temperature probe array using 90 nm IV CMOS, which shows plusmn1.4degC error for 40 ~ 110degC temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.\",\"PeriodicalId\":186095,\"journal\":{\"name\":\"2007 IEEE Asian Solid-State Circuits Conference\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Asian Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASSCC.2007.4425781\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2007.4425781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
本文提出了一种采用90 nm IV CMOS的16 × 16温度探头阵列，该阵列在40 ~ 110℃温度范围内误差为±1.4℃，实现了40帧/秒的温度分布测量。该阵列是针对VLSI芯片上各模块温度对应的工作频率和电源电压反馈系统而设计和开发的。采用精确的四晶体管温度探头电路，加上误差放大器和两个PMOS电流源，实现了连续热监测。
40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip
This paper presents a 16times16 temperature probe array using 90 nm IV CMOS, which shows plusmn1.4degC error for 40 ~ 110degC temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.
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