热像仪检测旁路激活二极管对光伏板现场性能的影响

Alexandru-Ionel Constantin, D. Marin, P. Anghelita, Ioan Tiberiu Şerban, C. Morari, Gabriela Iosif
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引用次数: 0

摘要

本文介绍了与旁路激活二极管故障的光伏(PV)面板性能评估相关的结果,通过使用两台热像仪进行热成像检测,作为对安装在国家电气工程研究与发展研究所(ICPE-CA)的8年并网12kw峰值电力系统屋顶进行预防性维护过程的一部分。光伏板的性能评估是基于使用HT I-V 400设备测量的电流电压(I-V)和功率电压(P-V)特性,将含有旁路激活二极管的故障光伏板与健康光伏板进行比较。
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On-site Performances Evaluation of Photovoltaic Panels Affected by Bypass Activated Diodes Detected with Thermal Cameras
The paper presents results related to photovoltaic (PV) panels performances evaluation on bypass activated diodes faults, detected by means of thermographic inspection using two thermal cameras, as part of a preventive maintenance process on 8 years old on-grid 12 kW peak power system roof top, installed at National Institute for Research and Development in Electrical Engineering ICPE-CA. The PV panels performance evaluation is based on comparison of the faulty PV panels that contains bypass activated diodes with healthy ones, using their Current-Voltage (I-V) and Power-Voltage (P-V) characteristics measured by means of the HT I-V 400 equipment.
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