调整jtag用于交流互连测试

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1270892

L. Whetsel

{"title":"调整jtag用于交流互连测试","authors":"L. Whetsel","doi":"10.1109/TEST.2003.1270892","DOIUrl":null,"url":null,"abstract":"The use of AC coupled interconnects to provide communication paths between devices are increasing. The existing IEEE 1149.1 boundary scan standard (JTAG) has limitations that hinder it from being able to effectively test all AC coupled interconnects. This paper describes a simple enhancement to the JTAG architecture enabling it to operate in new modes facilitating AC interconnect testing.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Adapting jtag for ac interconnect testing\",\"authors\":\"L. Whetsel\",\"doi\":\"10.1109/TEST.2003.1270892\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The use of AC coupled interconnects to provide communication paths between devices are increasing. The existing IEEE 1149.1 boundary scan standard (JTAG) has limitations that hinder it from being able to effectively test all AC coupled interconnects. This paper describes a simple enhancement to the JTAG architecture enabling it to operate in new modes facilitating AC interconnect testing.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1270892\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1270892","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

使用交流耦合互连来提供设备之间的通信路径正在增加。现有的IEEE 1149.1边界扫描标准(JTAG)存在一些限制，使其无法有效地测试所有交流耦合互连。本文描述了对JTAG体系结构的一个简单增强，使其能够在新的模式下工作，从而促进交流互连测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Adapting jtag for ac interconnect testing

The use of AC coupled interconnects to provide communication paths between devices are increasing. The existing IEEE 1149.1 boundary scan standard (JTAG) has limitations that hinder it from being able to effectively test all AC coupled interconnects. This paper describes a simple enhancement to the JTAG architecture enabling it to operate in new modes facilitating AC interconnect testing.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

International Test Conference, 2003. Proceedings. ITC 2003.

自引率

0.00%

发文量

期刊最新文献

Fault pattern oriented defect diagnosis for memories A built-in self-repair scheme for semiconductor memories with 2-d redundancy Cost-effective approach for reducing soft error failure rate in logic circuits A new maximal diagnosis algorithm for bus-structured systems Test vector generation based on correlation model for ratio-I/sub DDQ/