用新工艺制备的SI - GaAs探测器的性能

Filippo Nava, M. Alietti, Claudio Canali, Anna Cavallini, C. Papa, Valerio Re, C. Lanzieri
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引用次数: 0

摘要

在半绝缘(SI)砷化镓(GaAs)粒子探测器中观察到的非完全电荷收集效率通常归因于捕获效应。然而,文献中分析的大多数探测器只能在耗尽电压下工作。我们提出了一个仔细的分析输出信号和性能的SI GaAs探测器,低于和高于完全耗尽和/sup 241/Am /spl α /粒子照射。当检测器偏压低于完全耗尽时,输出信号受检测器本身未耗尽部分的影响,而当检测器工作在完全耗尽以上时,输出信号仅受电荷载流子的捕获-去捕获的影响。捕获-去捕获效应与探测器中存在的深能级分析一致。使用/sup 241/Am /spl alpha/源,能量分辨率达到1.1%。
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Performances of SI GaAs detectors fabricated with a new technology
The non complete charge collection efficiency observed in Semi-Insulating (SI) Gallium Arsenide (GaAs) particle detectors has been generally attributed to trapping effects. However most of the detectors analyzed in literature can only operate below the depletion voltage. We present a careful analysis of the output signal and of performances of SI GaAs detectors, operated below and above full depletion and irradiated with /sup 241/Am /spl alpha/ particles. When the detector is biased below full depletion the output signals are affected by the undepleted part of the detector itself, while, when the detector is operated above the full depletion, the output signals are only affected by trapping-detrapping of charge carriers. Trapping-detrapping effects are in agreement with the analysis of deep levels present in the detectors. An energy resolution of 1.1% has been achieved with an /sup 241/Am /spl alpha/ source.
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