{"title":"模数转换器技术比较","authors":"R. Walden","doi":"10.1109/GAAS.1994.636970","DOIUrl":null,"url":null,"abstract":"Analog-to-digital converters are ubiquitous, critical components of signal processing systems. This presentation surveys the state-of-the-art for ADCs and includes both experimental converters and commercially available parts. The shape of the distribution on a resolution vs. sampling rate graph provides insight into ADC performance limitations. For sampling frequencies ranging from /spl sim/0.5 MSPS to /spl sim/4 GSPS, resolution falls off by /spl sim/1 bit for every doubling of the sampling rate. This effect can be related to aperture jitter. For ADCs operating at /spl ges/4 GSPS, the speed of the device technology is a limiting factor. In order to push back these limits, many ADC architectures have been proposed and implemented.","PeriodicalId":328819,"journal":{"name":"Proceedings of 1994 IEEE GaAs IC Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"65","resultStr":"{\"title\":\"Analog-to-digital converter technology comparison\",\"authors\":\"R. Walden\",\"doi\":\"10.1109/GAAS.1994.636970\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analog-to-digital converters are ubiquitous, critical components of signal processing systems. This presentation surveys the state-of-the-art for ADCs and includes both experimental converters and commercially available parts. The shape of the distribution on a resolution vs. sampling rate graph provides insight into ADC performance limitations. For sampling frequencies ranging from /spl sim/0.5 MSPS to /spl sim/4 GSPS, resolution falls off by /spl sim/1 bit for every doubling of the sampling rate. This effect can be related to aperture jitter. For ADCs operating at /spl ges/4 GSPS, the speed of the device technology is a limiting factor. In order to push back these limits, many ADC architectures have been proposed and implemented.\",\"PeriodicalId\":328819,\"journal\":{\"name\":\"Proceedings of 1994 IEEE GaAs IC Symposium\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"65\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE GaAs IC Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GAAS.1994.636970\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE GaAs IC Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GAAS.1994.636970","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analog-to-digital converters are ubiquitous, critical components of signal processing systems. This presentation surveys the state-of-the-art for ADCs and includes both experimental converters and commercially available parts. The shape of the distribution on a resolution vs. sampling rate graph provides insight into ADC performance limitations. For sampling frequencies ranging from /spl sim/0.5 MSPS to /spl sim/4 GSPS, resolution falls off by /spl sim/1 bit for every doubling of the sampling rate. This effect can be related to aperture jitter. For ADCs operating at /spl ges/4 GSPS, the speed of the device technology is a limiting factor. In order to push back these limits, many ADC architectures have been proposed and implemented.