{"title":"关于2019 IEEE第28届亚洲测试研讨会","authors":"","doi":"10.1109/ats47505.2019.00005","DOIUrl":null,"url":null,"abstract":"The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians, and students working in India and abroad. ATS 2019 hopes to address design, test, and yield challenges faced by the industry with the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.","PeriodicalId":258824,"journal":{"name":"2019 IEEE 28th Asian Test Symposium (ATS)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"About the 2019 IEEE 28th Asian Test Symposium\",\"authors\":\"\",\"doi\":\"10.1109/ats47505.2019.00005\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians, and students working in India and abroad. ATS 2019 hopes to address design, test, and yield challenges faced by the industry with the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.\",\"PeriodicalId\":258824,\"journal\":{\"name\":\"2019 IEEE 28th Asian Test Symposium (ATS)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 28th Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ats47505.2019.00005\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 28th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ats47505.2019.00005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians, and students working in India and abroad. ATS 2019 hopes to address design, test, and yield challenges faced by the industry with the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.