{"title":"半导体中激光诱导可调谐聚焦","authors":"Nadav Shabairou, Z. Zalevsky, M. Sinvani","doi":"10.1364/isa.2022.iw1c.4","DOIUrl":null,"url":null,"abstract":"We demonstrate a novel method for focusing a probe IR pulse laser beam in semiconductors. The shaping was done by a temporaly modifying the material complex refractive index by a second pulse pump laser beam absorbed in the sample, using pump-prob experiment.","PeriodicalId":286361,"journal":{"name":"Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Laser-Induced Tunable Focusing in Semiconductors\",\"authors\":\"Nadav Shabairou, Z. Zalevsky, M. Sinvani\",\"doi\":\"10.1364/isa.2022.iw1c.4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate a novel method for focusing a probe IR pulse laser beam in semiconductors. The shaping was done by a temporaly modifying the material complex refractive index by a second pulse pump laser beam absorbed in the sample, using pump-prob experiment.\",\"PeriodicalId\":286361,\"journal\":{\"name\":\"Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/isa.2022.iw1c.4\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/isa.2022.iw1c.4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We demonstrate a novel method for focusing a probe IR pulse laser beam in semiconductors. The shaping was done by a temporaly modifying the material complex refractive index by a second pulse pump laser beam absorbed in the sample, using pump-prob experiment.
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