{"title":"用横向梯度通道掺杂和高k间隔层增强无结纳米线场效应管的性能","authors":"S. Sharma, B. Raj, M. Khosla","doi":"10.1109/GCCE.2015.7398608","DOIUrl":null,"url":null,"abstract":"We propose the use of laterally graded channel doping and High-K Spacers positioned on both sides of gate oxide to improve the Performance and thereby, the scalability of Junctionless Nanowire Field Effect Transistors (JLNWFET). The performance parameters of the device considered in this study are ION/IOFF ratio, Drain-Induced Barrier Lowering (DIBL) and Sub Threshold Slope (SS). Using extensive 3-D TCAD simulations, we have analyzed that the OFF-state leakage, DIBL and SS can be reduced owing to the combined use of laterally graded-doping channel and High-k Spacers.","PeriodicalId":363743,"journal":{"name":"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Performance enhancement of junctionless nanowire FET with laterally graded channel doping and high-K spacers\",\"authors\":\"S. Sharma, B. Raj, M. Khosla\",\"doi\":\"10.1109/GCCE.2015.7398608\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose the use of laterally graded channel doping and High-K Spacers positioned on both sides of gate oxide to improve the Performance and thereby, the scalability of Junctionless Nanowire Field Effect Transistors (JLNWFET). The performance parameters of the device considered in this study are ION/IOFF ratio, Drain-Induced Barrier Lowering (DIBL) and Sub Threshold Slope (SS). Using extensive 3-D TCAD simulations, we have analyzed that the OFF-state leakage, DIBL and SS can be reduced owing to the combined use of laterally graded-doping channel and High-k Spacers.\",\"PeriodicalId\":363743,\"journal\":{\"name\":\"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GCCE.2015.7398608\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GCCE.2015.7398608","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Performance enhancement of junctionless nanowire FET with laterally graded channel doping and high-K spacers
We propose the use of laterally graded channel doping and High-K Spacers positioned on both sides of gate oxide to improve the Performance and thereby, the scalability of Junctionless Nanowire Field Effect Transistors (JLNWFET). The performance parameters of the device considered in this study are ION/IOFF ratio, Drain-Induced Barrier Lowering (DIBL) and Sub Threshold Slope (SS). Using extensive 3-D TCAD simulations, we have analyzed that the OFF-state leakage, DIBL and SS can be reduced owing to the combined use of laterally graded-doping channel and High-k Spacers.