{"title":"基于EMTP的并联电抗器开关仿真","authors":"B. Vahidi, A. Ghatrehsamani, S.A. Kashi","doi":"10.1109/MELCON.2004.1348206","DOIUrl":null,"url":null,"abstract":"The work reported in this paper is EMTP simulation of reactor switching. The simulation has identified the causes of high transient overvoltage, which are produced when switching high voltage shunt reactors.","PeriodicalId":164818,"journal":{"name":"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Shunt reactor switching simulation by EMTP\",\"authors\":\"B. Vahidi, A. Ghatrehsamani, S.A. Kashi\",\"doi\":\"10.1109/MELCON.2004.1348206\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The work reported in this paper is EMTP simulation of reactor switching. The simulation has identified the causes of high transient overvoltage, which are produced when switching high voltage shunt reactors.\",\"PeriodicalId\":164818,\"journal\":{\"name\":\"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MELCON.2004.1348206\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MELCON.2004.1348206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The work reported in this paper is EMTP simulation of reactor switching. The simulation has identified the causes of high transient overvoltage, which are produced when switching high voltage shunt reactors.
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