热超声倒装芯片键合中键合压力对换能器超声传播的影响

Long Zhili, Han Lei, Wu Yunxin, Zhong Jue
{"title":"热超声倒装芯片键合中键合压力对换能器超声传播的影响","authors":"Long Zhili, Han Lei, Wu Yunxin, Zhong Jue","doi":"10.1109/HDP.2006.1707579","DOIUrl":null,"url":null,"abstract":"As one of the key bonding parameters for thermosonic flip chip bonding, bonding pressure plays an important role for the bonding process. Moreover, as the load of the ultrasonic transducer system, bonding pressure affects directly the process of ultrasonic propagation, so it will influence the bonding quality. In this paper, in the condition that the bonding pressure was tuned regularly, the impedance characteristics of ultrasonic transducer were measured by a impedance analyzer, and the ultrasonic energy was measured by a laser Doppler vibrometer, and the shear bonding strengths at different bonding pressure settings were attained. It is shown that when the bonding pressure increases, the resonance frequency and resistance of transducer will increase, while the conductance and ultrasonic energy will turn down, and a stable and satisfied bondability can be found at a moderate pressure window. The impedance model for ultrasonic transducer was created by an equivalent circuit, and used to analyze the experimental effect of bonding pressure on ultrasonic propagation for transducer","PeriodicalId":406794,"journal":{"name":"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.","volume":"298 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of bonding pressure on transducer ultrasonic propagation in thermosonic flip chip bonding\",\"authors\":\"Long Zhili, Han Lei, Wu Yunxin, Zhong Jue\",\"doi\":\"10.1109/HDP.2006.1707579\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As one of the key bonding parameters for thermosonic flip chip bonding, bonding pressure plays an important role for the bonding process. Moreover, as the load of the ultrasonic transducer system, bonding pressure affects directly the process of ultrasonic propagation, so it will influence the bonding quality. In this paper, in the condition that the bonding pressure was tuned regularly, the impedance characteristics of ultrasonic transducer were measured by a impedance analyzer, and the ultrasonic energy was measured by a laser Doppler vibrometer, and the shear bonding strengths at different bonding pressure settings were attained. It is shown that when the bonding pressure increases, the resonance frequency and resistance of transducer will increase, while the conductance and ultrasonic energy will turn down, and a stable and satisfied bondability can be found at a moderate pressure window. The impedance model for ultrasonic transducer was created by an equivalent circuit, and used to analyze the experimental effect of bonding pressure on ultrasonic propagation for transducer\",\"PeriodicalId\":406794,\"journal\":{\"name\":\"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.\",\"volume\":\"298 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HDP.2006.1707579\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HDP.2006.1707579","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

作为热超声倒装芯片键合的关键键合参数之一,键合压力对键合过程起着重要的作用。此外,键合压力作为超声换能器系统的载荷,直接影响超声波的传播过程,从而影响键合质量。本文在键合压力定时调节的条件下,利用阻抗分析仪测量超声波换能器的阻抗特性,利用激光多普勒测振仪测量超声波能量,得到了不同键合压力设置下的剪切键合强度。结果表明,当键合压力增大时,换能器的共振频率和电阻增大,而电导和超声能量减小,在中等压力窗口下可获得稳定且满意的键合性。利用等效电路建立了超声换能器的阻抗模型,分析了键合压力对换能器超声传播的实验影响
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Effect of bonding pressure on transducer ultrasonic propagation in thermosonic flip chip bonding
As one of the key bonding parameters for thermosonic flip chip bonding, bonding pressure plays an important role for the bonding process. Moreover, as the load of the ultrasonic transducer system, bonding pressure affects directly the process of ultrasonic propagation, so it will influence the bonding quality. In this paper, in the condition that the bonding pressure was tuned regularly, the impedance characteristics of ultrasonic transducer were measured by a impedance analyzer, and the ultrasonic energy was measured by a laser Doppler vibrometer, and the shear bonding strengths at different bonding pressure settings were attained. It is shown that when the bonding pressure increases, the resonance frequency and resistance of transducer will increase, while the conductance and ultrasonic energy will turn down, and a stable and satisfied bondability can be found at a moderate pressure window. The impedance model for ultrasonic transducer was created by an equivalent circuit, and used to analyze the experimental effect of bonding pressure on ultrasonic propagation for transducer
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Nanopackaging: nanotechnologies and electronics packaging Simulation design of capacitive Frisch grid CdZnTe detectors Curvature-compensated CMOS bandgap reference with 1.8-V operation Effect of Bi on the kinetics of intermetallics growth in Sn-3Ag-0.5Cu/Cu solder joint High-speed board-to-board interconnects utilizing flexible foils and elastomeric connectors
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1