超薄Si:P纳米线的全波段研究

H. Ryu, Sunhee Lee, Y. H. Tan, B. Weber, S. Mahapatra, M. Simmons, L. Hollenberg, Gerhard Klimeck
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引用次数: 0

摘要

研究了密掺磷超薄硅纳米线的金属性能和欧姆导电性能。采用10波段sp3 d5 s*紧密结合的方法从原子角度描述器件的电子结构。在平衡静电是自一致计算与我们的内部三维并行Schrödinger-Poisson求解器,是耦合到局部密度近似考虑电子交换相关模拟。我们不仅通过计算1.5nm宽和1/4原子单层掺杂[110]Si:P NW的平衡带结构来确认NW通道是金属的,而且通过计算一些NW通道的欧姆传导特性,并显示出与测量数据在定量上的良好一致性,为实验提供了强有力的联系。这项工作可以被强调为第一个用全波段原子方法研究Si:P NWs。
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Full-band study of ultra-thin Si:P nanowires
Metallic property and Ohmic conduction in densely phosphorus δ-doping ultra-thin silicon nanowires (Si:P NWs) are studied. A 10-band sp3 d5 s* tight-binding approach is used to describe device electronic structures atomistically. Electrostatics at equilibrium are self-consistently calculated with our in-house 3-D parallel Schrödinger-Poisson solver that is coupled to the Local Density Approximation to consider the electron exchange-correlation in simulations. We not only confirm the NW channel is metallic by calculating the equilibrium bandstructure of a 1.5nm wide and 1/4 atomic monolayer doping [110] Si:P NW, but also provide a strong connection to experiment by calculating ohmic conduction properties of a few NW channels and showing a quantitatively good agreement to the measured data. This work can be highlighted as the first study of Si:P NWs with a full-band atomistic approach.
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