基于0.18 μm CMOS的0.05 mm2 110 μ w 10-b自校准逐次逼近ADC核心

Y. Kuramochi, A. Matsuzawa, M. Kawabata
{"title":"基于0.18 μm CMOS的0.05 mm2 110 μ w 10-b自校准逐次逼近ADC核心","authors":"Y. Kuramochi, A. Matsuzawa, M. Kawabata","doi":"10.1109/ASSCC.2007.4425771","DOIUrl":null,"url":null,"abstract":"We present a 10-bit 1-MS/s successive approximation analog-to-digital converter core including a charge redistribution digital-to-analog converter and a comparator. A new linearity calibration technique enables use of a nearly minimum capacitor limited by kT/C noise. The ADC core without digital blocks has been fabricated in a 0.18-mum CMOS process and consumes 110muW at 1.8 V power supply. With the calibration it achieves 9.0-dB improvement of SNDR and 23.3dB improvement of SFDR. The measured SNDR and SFDR are 51.1 dB and 69.8 dB respectively.","PeriodicalId":186095,"journal":{"name":"2007 IEEE Asian Solid-State Circuits Conference","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"A 0.05-mm2 110-μW 10-b self-calibrating successive approximation ADC core in 0.18-μm CMOS\",\"authors\":\"Y. Kuramochi, A. Matsuzawa, M. Kawabata\",\"doi\":\"10.1109/ASSCC.2007.4425771\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a 10-bit 1-MS/s successive approximation analog-to-digital converter core including a charge redistribution digital-to-analog converter and a comparator. A new linearity calibration technique enables use of a nearly minimum capacitor limited by kT/C noise. The ADC core without digital blocks has been fabricated in a 0.18-mum CMOS process and consumes 110muW at 1.8 V power supply. With the calibration it achieves 9.0-dB improvement of SNDR and 23.3dB improvement of SFDR. The measured SNDR and SFDR are 51.1 dB and 69.8 dB respectively.\",\"PeriodicalId\":186095,\"journal\":{\"name\":\"2007 IEEE Asian Solid-State Circuits Conference\",\"volume\":\"90 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Asian Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASSCC.2007.4425771\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2007.4425771","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24

摘要

我们提出了一个10位1-MS/s连续近似模数转换器核心,包括电荷再分配数模转换器和比较器。一种新的线性校准技术可以使用受kT/C噪声限制的几乎最小的电容器。无数字模块的ADC核心已在0.18 μ m CMOS工艺中制造,在1.8 V电源下消耗110muW。经过标定,SNDR提高9.0 db, SFDR提高23.3dB。测量的SNDR和SFDR分别为51.1 dB和69.8 dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A 0.05-mm2 110-μW 10-b self-calibrating successive approximation ADC core in 0.18-μm CMOS
We present a 10-bit 1-MS/s successive approximation analog-to-digital converter core including a charge redistribution digital-to-analog converter and a comparator. A new linearity calibration technique enables use of a nearly minimum capacitor limited by kT/C noise. The ADC core without digital blocks has been fabricated in a 0.18-mum CMOS process and consumes 110muW at 1.8 V power supply. With the calibration it achieves 9.0-dB improvement of SNDR and 23.3dB improvement of SFDR. The measured SNDR and SFDR are 51.1 dB and 69.8 dB respectively.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A Field-programmable VLSI based on an asynchronous bit-serial architecture MuCCRA chips: Configurable dynamically-reconfigurable processors Interference from power/signal lines and to SRAM circuits in 65nm CMOS inductive-coupling link 40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip A 3.125 Gbps CMOS fully integrated optical receiver with adaptive analog equalizer
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1