{"title":"表面电荷和电流分布的红外探测","authors":"R. Burton, J.D. Selim","doi":"10.1109/MWSYM.1977.1124491","DOIUrl":null,"url":null,"abstract":"A technique has been devised using infrared detection of I/sup 2/R heating of conducting materials to determine the surface charge and current distributions on various objects. The measurement process is explained and comparisons between experimentally determined and actual charge and current distributions are presented.","PeriodicalId":299607,"journal":{"name":"1977 IEEE MTT-S International Microwave Symposium Digest","volume":"145 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1977-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Infrared Detection of Surface Charge and Current Distributions\",\"authors\":\"R. Burton, J.D. Selim\",\"doi\":\"10.1109/MWSYM.1977.1124491\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A technique has been devised using infrared detection of I/sup 2/R heating of conducting materials to determine the surface charge and current distributions on various objects. The measurement process is explained and comparisons between experimentally determined and actual charge and current distributions are presented.\",\"PeriodicalId\":299607,\"journal\":{\"name\":\"1977 IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"145 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1977-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1977 IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1977.1124491\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1977 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1977.1124491","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Infrared Detection of Surface Charge and Current Distributions
A technique has been devised using infrared detection of I/sup 2/R heating of conducting materials to determine the surface charge and current distributions on various objects. The measurement process is explained and comparisons between experimentally determined and actual charge and current distributions are presented.
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