{"title":"FE-STEM法XLPE形貌直接观察技术","authors":"M. Ishida, T. Okamoto","doi":"10.1109/CEIDP.1993.378882","DOIUrl":null,"url":null,"abstract":"The direct observation of the microscopic morphology of cross-linked polyethylene (XLPE) insulations, performed by a field-emission transmission scanning electron microscope (FE-STEM), which combines a new field emission-type electron source and electron beam scanning. It has been found that the spherulite structures (subtle density difference) in unstained XLPE insulations can be observed in terms of the difference in contrast by means of the FE-STEM method. The density of spherulite structures in the XLPE insulation is higher than that of the regions between spherulites. These spherulite structures are dispersed and do not have clear borders.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Direct observation technique of XLPE morphology through the FE-STEM method\",\"authors\":\"M. Ishida, T. Okamoto\",\"doi\":\"10.1109/CEIDP.1993.378882\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The direct observation of the microscopic morphology of cross-linked polyethylene (XLPE) insulations, performed by a field-emission transmission scanning electron microscope (FE-STEM), which combines a new field emission-type electron source and electron beam scanning. It has been found that the spherulite structures (subtle density difference) in unstained XLPE insulations can be observed in terms of the difference in contrast by means of the FE-STEM method. The density of spherulite structures in the XLPE insulation is higher than that of the regions between spherulites. These spherulite structures are dispersed and do not have clear borders.<<ETX>>\",\"PeriodicalId\":149803,\"journal\":{\"name\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1993.378882\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1993.378882","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Direct observation technique of XLPE morphology through the FE-STEM method
The direct observation of the microscopic morphology of cross-linked polyethylene (XLPE) insulations, performed by a field-emission transmission scanning electron microscope (FE-STEM), which combines a new field emission-type electron source and electron beam scanning. It has been found that the spherulite structures (subtle density difference) in unstained XLPE insulations can be observed in terms of the difference in contrast by means of the FE-STEM method. The density of spherulite structures in the XLPE insulation is higher than that of the regions between spherulites. These spherulite structures are dispersed and do not have clear borders.<>
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