{"title":"适合无线网络MPSoC的自组织可靠性","authors":"M. Heil, C. Tanougast, C. Killian, A. Dandache","doi":"10.1109/ICM.2013.6735020","DOIUrl":null,"url":null,"abstract":"This paper presents a self-organized reliability technique to efficiently handle error localization in a Wireless Networked MPSoC. The wireless multi-node system consists of several nodes integrating MPSoC based Network-on-Chip (NoC) and communicating through ZigBee communication. We focus on the error detection and localization in NoCs located in each node of the wireless multi-node system. We propose a new offline test mechanism to efficiently detect and locate permanent errors in the networked NoCs. The proposed mechanism relies on delocalized tests performed through ZigBee wireless communication. We give the basic concepts of the proposed approach and timing estimations.","PeriodicalId":372346,"journal":{"name":"2013 25th International Conference on Microelectronics (ICM)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Self-organized reliability suitable for Wireless Networked MPSoC\",\"authors\":\"M. Heil, C. Tanougast, C. Killian, A. Dandache\",\"doi\":\"10.1109/ICM.2013.6735020\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a self-organized reliability technique to efficiently handle error localization in a Wireless Networked MPSoC. The wireless multi-node system consists of several nodes integrating MPSoC based Network-on-Chip (NoC) and communicating through ZigBee communication. We focus on the error detection and localization in NoCs located in each node of the wireless multi-node system. We propose a new offline test mechanism to efficiently detect and locate permanent errors in the networked NoCs. The proposed mechanism relies on delocalized tests performed through ZigBee wireless communication. We give the basic concepts of the proposed approach and timing estimations.\",\"PeriodicalId\":372346,\"journal\":{\"name\":\"2013 25th International Conference on Microelectronics (ICM)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 25th International Conference on Microelectronics (ICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2013.6735020\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 25th International Conference on Microelectronics (ICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2013.6735020","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Self-organized reliability suitable for Wireless Networked MPSoC
This paper presents a self-organized reliability technique to efficiently handle error localization in a Wireless Networked MPSoC. The wireless multi-node system consists of several nodes integrating MPSoC based Network-on-Chip (NoC) and communicating through ZigBee communication. We focus on the error detection and localization in NoCs located in each node of the wireless multi-node system. We propose a new offline test mechanism to efficiently detect and locate permanent errors in the networked NoCs. The proposed mechanism relies on delocalized tests performed through ZigBee wireless communication. We give the basic concepts of the proposed approach and timing estimations.