模拟阵列芯片AC-1.3用于低温、中子通量和累积辐射剂量效应条件下的刀具工程任务

O. Dvornikov, N. Prokopenko, I. Pakhomov, A. Bugakova
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引用次数: 9

摘要

阵列芯片AC-1.3(白俄罗斯明斯克OJSC“Integral”)是构建20多个集成电路(ic)的基础,用于工具工程和诊断。本文介绍了低温(- -190℃以下)和辐射对结构中含有AC-1.3的n-p-n、p-n-p双极晶体管和jfet直流特性和电流增益(β)影响的实验研究结果。本文给出了基于AC-1.3的新型半定制微电路在空间条件下工作的设计建议。
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The analog array chip AC-1.3 for the tasks of tool engineering in conditions of cryogenic temperature, neutron flux and cumulative radiation dose effects
The array chip AC-1.3 (OJSC “Integral” Minsk, Belarus) is a base for construction of more than 20 integrated circuits (ICs) for the goals of tool engineering and diagnostics. The article presents the results obtained in experimental studies of the effects of low-temperatures (up to minus -190°C and radiation on the DC characteristics and the current gain (β) of n-p-n and p-n-p bipolar transistors and also JFETs, which contain AC-1.3 in their structure. The paper gives design recommendations for new semi custom microcircuits based on AC-1.3, operating in space conditions.
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