利用Geant4模拟研究用于探测聚变中子的半导体探测器

K. Kaperoni, M. Diakaki, M. Kokkoris, M. Axiotis, A. Ziagkova, C. Weiss, R. Vlastou
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引用次数: 0

摘要

为了确定聚变反应堆的可行性和进展以及安全问题,精确的中子通量测量是必不可少的。半导体中子探测器在聚变反应堆的极端环境条件下表现出良好的运行特性。硅、金刚石和碳化硅是构建高效耐辐照探测器的重要材料。ITER聚变反应堆有望在不久的将来进行D-D等离子体测量,因此用合适的探测器探测2.45 MeV中子具有重要而紧迫的意义。在本工作中,研究了2.45 MeV中子与硅、金刚石和碳化硅探测器的相互作用,使用GEANT4[1]模拟,以比较它们的响应。随后将在NCSR“Demokritos”的I.N.P.P.的TANDEM加速器的中子生产设施进行实验研究,探测器由CIVIDEC仪器有限公司提供,因此相应地建立了模拟的几何形状。在TiT靶中通过3H(p,n)反应产生了2.45 MeV的准单能中子束。由于反应截面小,在模拟中采用偏置技术来提高计数率,从而产生逼真的结果。对这些偏置技术进行了研究,进行了各种试验,并对影响偏置系数选择的参数进行了说明和讨论。
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Semiconductor Detector Study for Detecting Fusion Neutrons using Geant4 Simulations
Accurate neutron flux measurements in fusion reactors are essential, in order to determine the feasibility and progress of the reaction as well as for safety issues. Semiconductor neutron detectors exhibit promising characteristics for operation in the extreme environmental conditions of fusion reactors. Silicon, Diamond and Silicon Carbide are the most studied and anticipated materials for constructing detectors with high efficiency and irradiation resistance. The ITER fusion reactor is expected to run D-D plasma measurements in the near future, so the detection of 2.45 MeV neutrons with appropriate detectors is of great and immediate importance. In the present work the study of 2.45 MeV neutrons interactions with a silicon, diamond and silicon carbide detector was made, using GEANT4 [1] simulations, in order to compare their response. An experimental study will follow at the neutron production facility of the TANDEM accelerator of the I.N.P.P. of the NCSR “Demokritos”, with detectors provided by CIVIDEC Instrumentation GmbH, so the geometry of the simulations was built accordingly. A quasi-monoenergetic neutron beam of 2.45 MeV was produced through 3H(p,n) reactions in a TiT target. Due to the low cross section of the reaction, biasing techniques were implemented in the simulation to increase the counting rate and thus producing realistic results. These biasing techniques were studied, with various tests and the parameters affecting the choice of the biasing factor are shown and discussed.
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