基于时域EMI测试的快速试错法——一种加快产品EMC符合性的新方法

Wei Wu, Yuejia Wu
{"title":"基于时域EMI测试的快速试错法——一种加快产品EMC符合性的新方法","authors":"Wei Wu, Yuejia Wu","doi":"10.1109/MEEE57080.2023.10127024","DOIUrl":null,"url":null,"abstract":"Product EMC compliance processing is expensive and time-consuming. Rapid trials-and-errors approach is proposed in this paper to reduce the costs and shorten the time achieving product EMC compliance. The time-domain EMI testing technique can meet the fast-testing requirements of the approach, and a time-domain EMI testing system developed based on a general-purpose oscilloscope and Cloud Computing is presented to further meet the low-cost testing needs of the approach. The application case shows that by applying the proposed low-cost and fast-EMI-test system, engineers in manufacturing companies can reduce the EMI of EUT through frequent and rapid trials-and-errors in short time and low cost without EMC expertise.","PeriodicalId":168205,"journal":{"name":"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-02-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Rapid Trials-and-Errors Approach Based on Time-domain EMI Testing–a New Way to Speed up Product EMC Compliance\",\"authors\":\"Wei Wu, Yuejia Wu\",\"doi\":\"10.1109/MEEE57080.2023.10127024\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Product EMC compliance processing is expensive and time-consuming. Rapid trials-and-errors approach is proposed in this paper to reduce the costs and shorten the time achieving product EMC compliance. The time-domain EMI testing technique can meet the fast-testing requirements of the approach, and a time-domain EMI testing system developed based on a general-purpose oscilloscope and Cloud Computing is presented to further meet the low-cost testing needs of the approach. The application case shows that by applying the proposed low-cost and fast-EMI-test system, engineers in manufacturing companies can reduce the EMI of EUT through frequent and rapid trials-and-errors in short time and low cost without EMC expertise.\",\"PeriodicalId\":168205,\"journal\":{\"name\":\"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-02-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEEE57080.2023.10127024\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEEE57080.2023.10127024","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

产品EMC合规性处理既昂贵又耗时。本文提出了快速试错法,以降低成本,缩短产品实现EMC合规的时间。时域电磁干扰测试技术可以满足该方法的快速测试要求,为进一步满足该方法的低成本测试需求,提出了一种基于通用示波器和云计算的时域电磁干扰测试系统。应用实例表明,采用本文提出的低成本、快速的电磁干扰测试系统,制造企业的工程师可以在没有电磁干扰专业知识的情况下,在短时间、低成本地通过频繁、快速的试验和错误来降低EUT的电磁干扰。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Rapid Trials-and-Errors Approach Based on Time-domain EMI Testing–a New Way to Speed up Product EMC Compliance
Product EMC compliance processing is expensive and time-consuming. Rapid trials-and-errors approach is proposed in this paper to reduce the costs and shorten the time achieving product EMC compliance. The time-domain EMI testing technique can meet the fast-testing requirements of the approach, and a time-domain EMI testing system developed based on a general-purpose oscilloscope and Cloud Computing is presented to further meet the low-cost testing needs of the approach. The application case shows that by applying the proposed low-cost and fast-EMI-test system, engineers in manufacturing companies can reduce the EMI of EUT through frequent and rapid trials-and-errors in short time and low cost without EMC expertise.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Analysis of Fluid Field and Temperature Field of Permanent Magnet Synchronous Motor for Special Vehicles Highly Sensitive MIM-Based Semi-circular Refractive Index Sensor for Detection of Glucose Concentration Capacitor Allocation Optimization for Improved Distribution Network Performance Structural Design and Simulation Analysis of Two-Dimensional Space Turntable Intelligent Power Management Control System Modelling for Battery/Supercapacitor Electric Vehicles Using MBSE and SysML
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1