{"title":"基于时域EMI测试的快速试错法——一种加快产品EMC符合性的新方法","authors":"Wei Wu, Yuejia Wu","doi":"10.1109/MEEE57080.2023.10127024","DOIUrl":null,"url":null,"abstract":"Product EMC compliance processing is expensive and time-consuming. Rapid trials-and-errors approach is proposed in this paper to reduce the costs and shorten the time achieving product EMC compliance. The time-domain EMI testing technique can meet the fast-testing requirements of the approach, and a time-domain EMI testing system developed based on a general-purpose oscilloscope and Cloud Computing is presented to further meet the low-cost testing needs of the approach. The application case shows that by applying the proposed low-cost and fast-EMI-test system, engineers in manufacturing companies can reduce the EMI of EUT through frequent and rapid trials-and-errors in short time and low cost without EMC expertise.","PeriodicalId":168205,"journal":{"name":"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-02-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Rapid Trials-and-Errors Approach Based on Time-domain EMI Testing–a New Way to Speed up Product EMC Compliance\",\"authors\":\"Wei Wu, Yuejia Wu\",\"doi\":\"10.1109/MEEE57080.2023.10127024\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Product EMC compliance processing is expensive and time-consuming. Rapid trials-and-errors approach is proposed in this paper to reduce the costs and shorten the time achieving product EMC compliance. The time-domain EMI testing technique can meet the fast-testing requirements of the approach, and a time-domain EMI testing system developed based on a general-purpose oscilloscope and Cloud Computing is presented to further meet the low-cost testing needs of the approach. The application case shows that by applying the proposed low-cost and fast-EMI-test system, engineers in manufacturing companies can reduce the EMI of EUT through frequent and rapid trials-and-errors in short time and low cost without EMC expertise.\",\"PeriodicalId\":168205,\"journal\":{\"name\":\"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-02-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEEE57080.2023.10127024\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 2nd International Conference on Mechatronics and Electrical Engineering (MEEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEEE57080.2023.10127024","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Rapid Trials-and-Errors Approach Based on Time-domain EMI Testing–a New Way to Speed up Product EMC Compliance
Product EMC compliance processing is expensive and time-consuming. Rapid trials-and-errors approach is proposed in this paper to reduce the costs and shorten the time achieving product EMC compliance. The time-domain EMI testing technique can meet the fast-testing requirements of the approach, and a time-domain EMI testing system developed based on a general-purpose oscilloscope and Cloud Computing is presented to further meet the low-cost testing needs of the approach. The application case shows that by applying the proposed low-cost and fast-EMI-test system, engineers in manufacturing companies can reduce the EMI of EUT through frequent and rapid trials-and-errors in short time and low cost without EMC expertise.