{"title":"基于关键路径跟踪技术的并行x -故障仿真","authors":"R. Ubar, S. Devadze, J. Raik, A. Jutman","doi":"10.1109/DATE.2010.5456929","DOIUrl":null,"url":null,"abstract":"In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The method is based on a two-phase procedure. In the first phase, a parallel exact critical path fault tracing is used to determine all the detected stuck-at faults in the circuit, and in the second phase a postprocess is launched which will determine the detectability of X-faults.","PeriodicalId":432902,"journal":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":"{\"title\":\"Parallel X-fault simulation with critical path tracing technique\",\"authors\":\"R. Ubar, S. Devadze, J. Raik, A. Jutman\",\"doi\":\"10.1109/DATE.2010.5456929\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The method is based on a two-phase procedure. In the first phase, a parallel exact critical path fault tracing is used to determine all the detected stuck-at faults in the circuit, and in the second phase a postprocess is launched which will determine the detectability of X-faults.\",\"PeriodicalId\":432902,\"journal\":{\"name\":\"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"36\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DATE.2010.5456929\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DATE.2010.5456929","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Parallel X-fault simulation with critical path tracing technique
In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The method is based on a two-phase procedure. In the first phase, a parallel exact critical path fault tracing is used to determine all the detected stuck-at faults in the circuit, and in the second phase a postprocess is launched which will determine the detectability of X-faults.