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引用次数: 4
摘要
随着高性能DRAM领域已经扩展到千兆级[1,2],大设备尺寸一直是主要问题,在获得可接受的产量和功耗方面提出了挑战。由于芯片总尺寸与最小特征尺寸的比例迅速增加,即使是最小的缺陷也会导致故障,往往很难分析。此外,由于高速同步银行交错操作,功耗大,需要严格控制外围区域的功率预算。Th我年代提出设计技术利用n d e p e n d e n t赋控制方案和分层译码方案t o达到增强的失效分析,更低的能耗,更小的芯片尺寸原型lGbit同步DRAM (SDRAM)。
A 1Gbit SDRAM With An Independent Sub-array Controlled Scheme And A Hierarchical Decoding Scheme
A s the realm of high performance DRAM has been extended up to the Gigabit scale [1 ,2 ] , the large device size has been the major concern, presenting challenges in attaining acceptable yield and power consumption. A s the ratio of the total chip s ize and the minimum feature s ize is rapidly increased, even the smallest defects will cause failures, often very difficult t o analyze. Moreover, with high speed synchronous bank interleaving operation, the power consumption is large, requring a tight control of the power budget in the peripheral regions. Th i s paper presents design techniques utilizing the i n d e p e n d e n t sub-array controlled scheme and the hierarchical decoding scheme t o achieve enhanced failure analysis, lower power consumption, and smaller chip size in a prototype lGbit synchronous DRAM (SDRAM).