{"title":"电路板生命周期测试，用于无线产品的有效npi管理","authors":"T. Piironen","doi":"10.1109/TEST.2003.1271220","DOIUrl":null,"url":null,"abstract":"DSP processing power of the product itself is used more and more to replace external measurement and test instruments leading to lower investment costs at manufacturing. This is affecting greatly on test strategies used in product development. Design for Testing (DFT) has to be considered in very early design phases and consists integral part of the later design and implementation phases, too. In addition to production the whole life-cycle of the product, including field use, service and maintenance has also been integrated into test strategies. This is emphasizing the importance of selfdiagnostics functions of the product. As a result the management of test integration in R&D has become a critical success factor.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Board life-cycle testing for effective npi management of wireless products\",\"authors\":\"T. Piironen\",\"doi\":\"10.1109/TEST.2003.1271220\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"DSP processing power of the product itself is used more and more to replace external measurement and test instruments leading to lower investment costs at manufacturing. This is affecting greatly on test strategies used in product development. Design for Testing (DFT) has to be considered in very early design phases and consists integral part of the later design and implementation phases, too. In addition to production the whole life-cycle of the product, including field use, service and maintenance has also been integrated into test strategies. This is emphasizing the importance of selfdiagnostics functions of the product. As a result the management of test integration in R&D has become a critical success factor.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1271220\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1271220","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Board life-cycle testing for effective npi management of wireless products
DSP processing power of the product itself is used more and more to replace external measurement and test instruments leading to lower investment costs at manufacturing. This is affecting greatly on test strategies used in product development. Design for Testing (DFT) has to be considered in very early design phases and consists integral part of the later design and implementation phases, too. In addition to production the whole life-cycle of the product, including field use, service and maintenance has also been integrated into test strategies. This is emphasizing the importance of selfdiagnostics functions of the product. As a result the management of test integration in R&D has become a critical success factor.
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