在测试过程中调节功率晶体管温度的装置

2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) Pub Date : 2014-10-01 DOI:10.1109/APEIE.2014.7040829

Bespalov Nikolay Nikolaevich, Ilyin Mickhail Vladimirovich, Leontyev Ilya Alekseevich

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摘要

只提供摘要形式。本文讨论了一种用于测定半导体器件热敏特性和电学特性及参数的温度控制装置。利用珀耳帖元件来调节和稳定半导体器件的温度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Device for regulating the temperature of the power transistors during the test

Summary form only given. The article discusses a device for temperature control of semiconductor devices used in determining their heat-sensitive and electrical characteristics and parameters. To regulate and stabilize the temperature of semiconductor device used Peltier elements.

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2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE)

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