基于期望签名自生成的延迟故障内置自诊断机制

2019 IEEE 28th Asian Test Symposium (ATS) Pub Date : 2019-12-01 DOI:10.1109/ATS47505.2019.000-4

Yushiro Hiramoto, S. Ohtake, Hiroshi Takahashi

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引用次数: 1

摘要

在本文中，我们提出了一种内置自诊断机制(BISD)来诊断由退化引起的延迟故障。这种机制只使用较慢的时钟动态生成预期签名，并且不需要内存来存储预先计算的预期签名。在我们的实验中，提出的BISD机制应用于基准电路。评估区域开销和诊断分辨率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation of Expected Signatures

In this paper, we propose a built-in self-diagnosis (BISD) mechanism for delay faults induced by degradation. This mechanism solely generates expected signatures using slower clock on the fly and requires no memory for storing pre-computed expected signatures. In our experiment, the proposed BISD mechanism is applied to benchmark circuits. Area overhead and diagnostic resolution are evaluated.

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2019 IEEE 28th Asian Test Symposium (ATS)

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