F. Duan, S. Cooper, A. Marathe, J. Zhang, S. Jayanarayanan
{"title":"加速退化试验中监测电压对寿命外推的影响","authors":"F. Duan, S. Cooper, A. Marathe, J. Zhang, S. Jayanarayanan","doi":"10.1109/IRWS.2006.305229","DOIUrl":null,"url":null,"abstract":"During the accelerated stressing test, not only the stress voltage affects the lifetime extrapolation but also the monitoring voltage plays a considerable role. We have conducted a series of tests in various stress and monitoring voltages to quantify this impact. We have seen ~20 times difference on lifetime at monitoring voltages of 1.0V and 1.5V under a same stressed voltage. This difference should be taken into account to accurately predict the lifetime at normal use conditions from the data obtained in accelerated life test","PeriodicalId":199223,"journal":{"name":"2006 IEEE International Integrated Reliability Workshop Final Report","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests\",\"authors\":\"F. Duan, S. Cooper, A. Marathe, J. Zhang, S. Jayanarayanan\",\"doi\":\"10.1109/IRWS.2006.305229\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"During the accelerated stressing test, not only the stress voltage affects the lifetime extrapolation but also the monitoring voltage plays a considerable role. We have conducted a series of tests in various stress and monitoring voltages to quantify this impact. We have seen ~20 times difference on lifetime at monitoring voltages of 1.0V and 1.5V under a same stressed voltage. This difference should be taken into account to accurately predict the lifetime at normal use conditions from the data obtained in accelerated life test\",\"PeriodicalId\":199223,\"journal\":{\"name\":\"2006 IEEE International Integrated Reliability Workshop Final Report\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE International Integrated Reliability Workshop Final Report\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRWS.2006.305229\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Integrated Reliability Workshop Final Report","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRWS.2006.305229","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests
During the accelerated stressing test, not only the stress voltage affects the lifetime extrapolation but also the monitoring voltage plays a considerable role. We have conducted a series of tests in various stress and monitoring voltages to quantify this impact. We have seen ~20 times difference on lifetime at monitoring voltages of 1.0V and 1.5V under a same stressed voltage. This difference should be taken into account to accurately predict the lifetime at normal use conditions from the data obtained in accelerated life test