{"title":"模块/系统环境下堆叠封装热性能建模","authors":"Guixiang Tan, Yinan Wu","doi":"10.1109/STHERM.2005.1412191","DOIUrl":null,"url":null,"abstract":"Package thermal performance is determined by package design and its environment in a system. In reality, it is often costly, and sometimes impossible to include all the detailed features of a package into its system thermal management simulation. This is particularly true for stacked packages due to the design complexity. This paper proposes a methodology to realistically model stacked packages by simplifying the detailed package using a compact model with correlated equivalent thermal performance through a design of experiment (DOE) approach. The correlation between the compact model and package detailed model showed a less than 6.5% error under various boundary conditions, and thus becomes a powerful tool for further evaluation and optimization of the package thermal design.","PeriodicalId":256936,"journal":{"name":"Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Modeling of stacked packaging thermal performance in module/system environment\",\"authors\":\"Guixiang Tan, Yinan Wu\",\"doi\":\"10.1109/STHERM.2005.1412191\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Package thermal performance is determined by package design and its environment in a system. In reality, it is often costly, and sometimes impossible to include all the detailed features of a package into its system thermal management simulation. This is particularly true for stacked packages due to the design complexity. This paper proposes a methodology to realistically model stacked packages by simplifying the detailed package using a compact model with correlated equivalent thermal performance through a design of experiment (DOE) approach. The correlation between the compact model and package detailed model showed a less than 6.5% error under various boundary conditions, and thus becomes a powerful tool for further evaluation and optimization of the package thermal design.\",\"PeriodicalId\":256936,\"journal\":{\"name\":\"Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-03-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.2005.1412191\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.2005.1412191","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling of stacked packaging thermal performance in module/system environment
Package thermal performance is determined by package design and its environment in a system. In reality, it is often costly, and sometimes impossible to include all the detailed features of a package into its system thermal management simulation. This is particularly true for stacked packages due to the design complexity. This paper proposes a methodology to realistically model stacked packages by simplifying the detailed package using a compact model with correlated equivalent thermal performance through a design of experiment (DOE) approach. The correlation between the compact model and package detailed model showed a less than 6.5% error under various boundary conditions, and thus becomes a powerful tool for further evaluation and optimization of the package thermal design.