{"title":"交联聚乙烯绝缘电气树状现象的诊断","authors":"Y. Juan, S. Birlasekaran","doi":"10.1109/EEIC.2005.1566250","DOIUrl":null,"url":null,"abstract":"Electrical tree formed in XLPE insulation sliced from 220 kV rated cable was diagnosed by partial discharge and dielectrometry measurements and optical observation. The effects of aging by rate of rise in electrical stress and time are reported. Observed intermittent light emission and tree paths supported the theory of emission of protons due to high energy electrons","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Diagnosis of electrical treeing phenomenon in XLPE insulation\",\"authors\":\"Y. Juan, S. Birlasekaran\",\"doi\":\"10.1109/EEIC.2005.1566250\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrical tree formed in XLPE insulation sliced from 220 kV rated cable was diagnosed by partial discharge and dielectrometry measurements and optical observation. The effects of aging by rate of rise in electrical stress and time are reported. Observed intermittent light emission and tree paths supported the theory of emission of protons due to high energy electrons\",\"PeriodicalId\":267510,\"journal\":{\"name\":\"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EEIC.2005.1566250\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEIC.2005.1566250","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Diagnosis of electrical treeing phenomenon in XLPE insulation
Electrical tree formed in XLPE insulation sliced from 220 kV rated cable was diagnosed by partial discharge and dielectrometry measurements and optical observation. The effects of aging by rate of rise in electrical stress and time are reported. Observed intermittent light emission and tree paths supported the theory of emission of protons due to high energy electrons