未来非易失性存储器技术:挑战与应用

N. Aswathy, N. M. Sivamangai
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引用次数: 0

摘要

新兴非易失性存储器(NVM)器件是存储器领域的一项技术进步,对现有的硅基应用提出了严峻的挑战。本文主要对现有的和各种新兴的存储技术进行研究,以探索其研究领域。FeRAM(铁电随机存取存储器)、PCM(相变存储器)、MRAM(磁性随机存取存储器)和RRAM(电阻随机存取存储器)是为此目的考虑的一些存储器类型,每种存储器都有自己的优缺点。性能比较说明了在四种存储器中识别“通用存储器”的复杂性。在本文中,我们首先回顾传统的内存技术,随后我们将讨论更多关于NVM内存技术的高级研究。
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Future Nonvolatile Memory Technologies: Challenges and Applications
Emerging Nonvolatile Memory (NVM) devices is a technology advancement in the area of memories, which is giving a tough challenge to the existing silicon based application. This paper focuses mainly on the present and various emerging memory technologies, in order to explore its research domains. FeRAM (ferroelectric random-access memory), PCM (phase-change memory), MRAM (magnetic random-access memory) and RRAM (resistive random-access memory) are some of the types of memories taken into consideration for this purpose, with each having its own pros and cons. The performance comparison illustrates the complexity to identify the “universal memory” among the four. In this article, initially we revisit the conventional memory technologies and later part we will discuss more on the advanced studies of NVM memory technologies.
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